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Electronics

Electromagnetics

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Displaying 1351 - 1375 of 1583

Growth and properties of YBa2Cu3O7 thin films on vicinal and polycrystalline MgO substrates

December 21, 1990
Author(s)
Stephen E. Russek, Brian H. Moeckly, D. K. Lathrop, R A. Buhrman, M. G. Norton, C, B. Carter
We discuss the results of a study on the growth by laser ablation of YBa2Cu3O7 thin films on polycrystalline and annealed vicinal (001) MgO substrates. In both instances the filss were found to grow predominantly with the c axis normal the the plane of the

Transport properties of high-angle grain boundary weak links in YBa2Cu307 thin films

December 3, 1990
Author(s)
Stephen E. Russek, D. K. Lathrop, Brian H. Moeckly, R A. Buhrman
By patterning ~ l-um-wide microbridges in laser ablated YBa2Cu3O7, films containing high-angle tilt boundaries, weak links have been isolated with critical currents low enough to avoid self-screening effects. The current-voltage characteristics of these

MMIC Package Characterization with Active Loads

November 1, 1990
Author(s)
K. R. Phillips, Dylan Williams
Abstract: A technique for characterizing microwave packages based on active PIN diode standards is discussed. The technique allows packages to be accurately characterized from external reflection coefficient measurements when a single bias-dependent active

Progress Toward MMIC On-Wafer Standards

November 1, 1990
Author(s)
Dylan F. Williams, Roger Marks, K. R. Phillips, T. Miers
A prototype standard set in coplanar waveguide suitable for the calibration of wafer probe stations has been developed through a cooperative effort between the National Institute of Standards and Technology and a MIMIC Phase 3 team. The coplanar standard

The Interpretation and Use of S-Parameters in Lossy Lines

November 1, 1990
Author(s)
Dylan F. Williams, Roger Marks
Although a fundamental parameter of transmission lines, the characteristic impedance is difficult to measure accurately. We suggest a method by which it may be easily determined from a measurement of the propagation constant. The method is based on a

Scaling behavior of YBa 2 Cu 3 O 7 delta thin-film weak links

July 6, 1990
Author(s)
Stephen E. Russek, D. K. Lathrop, D. H. Shin, Brian H. Moeckly, R A. Buhrman, J. Silcox
The superconductive weak link properties of microbridges formed in c-axis normal YBa 2 Cu 3 O 7 δ polycrystalline thin films containing a variable amount of large angle tilt boundaries have been studied. In the low critical current density limit these weak
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