Russek, S.
, Lathrop, D.
, Shin, D.
, Moeckly, B.
, Buhrman, R.
and Silcox, J.
(1990),
Scaling behavior of YBa 2 Cu 3 O 7 delta thin-film weak links, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905476
(Accessed October 7, 2025)
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Scaling behavior of YBa 2 Cu 3 O 7 delta thin-film weak links
Published
Author(s)
, D. K. Lathrop, D. H. Shin, Brian H. Moeckly, R A. Buhrman, J. Silcox
Abstract
The superconductive weak link properties of microbridges formed in c-axis normal YBa 2 Cu 3 O 7 δ polycrystalline thin films containing a variable amount of large angle tilt boundaries have been studied. In the low critical current density limit these weak links have current-voltage (I-V) characteristics that are accurately modeled by the resistively shunted junction model. The I-V's are found to accurately follow a simple scaling law with the product of the critical current and weak link resistance Rn varying linearly with the weak link conductance.Citation
Applied Physics Letters
Volume
57
Pub Type
Journals
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Created July 6, 1990, Updated February 19, 2017