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Scaling behavior of YBa 2 Cu 3 O 7 delta thin-film weak links



Stephen E. Russek, D. K. Lathrop, D. H. Shin, Brian H. Moeckly, R A. Buhrman, J. Silcox


The superconductive weak link properties of microbridges formed in c-axis normal YBa 2 Cu 3 O 7 δ polycrystalline thin films containing a variable amount of large angle tilt boundaries have been studied. In the low critical current density limit these weak links have current-voltage (I-V) characteristics that are accurately modeled by the resistively shunted junction model. The I-V's are found to accurately follow a simple scaling law with the product of the critical current and weak link resistance Rn varying linearly with the weak link conductance.
Applied Physics Letters


Russek, S. , Lathrop, D. , Shin, D. , Moeckly, B. , Buhrman, R. and Silcox, J. (1990), Scaling behavior of YBa 2 Cu 3 O 7 delta thin-film weak links, Applied Physics Letters, [online], (Accessed July 24, 2024)


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Created July 6, 1990, Updated February 19, 2017