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Scaling behavior of YBa 2 Cu 3 O 7 delta thin-film weak links

Published

Author(s)

Stephen E. Russek, D. K. Lathrop, D. H. Shin, Brian H. Moeckly, R A. Buhrman, J. Silcox

Abstract

The superconductive weak link properties of microbridges formed in c-axis normal YBa 2 Cu 3 O 7 δ polycrystalline thin films containing a variable amount of large angle tilt boundaries have been studied. In the low critical current density limit these weak links have current-voltage (I-V) characteristics that are accurately modeled by the resistively shunted junction model. The I-V's are found to accurately follow a simple scaling law with the product of the critical current and weak link resistance Rn varying linearly with the weak link conductance.
Citation
Applied Physics Letters
Volume
57

Citation

Russek, S. , Lathrop, D. , Shin, D. , Moeckly, B. , Buhrman, R. and Silcox, J. (1990), Scaling behavior of YBa 2 Cu 3 O 7 delta thin-film weak links, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905476 (Accessed November 26, 2022)
Created July 6, 1990, Updated February 19, 2017