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Software techniques to improve data reliability in superconductor and low-resistance measurements

Published

Author(s)

Loren F. Goodrich, A N. Srivastava
Citation
Journal of Research (NIST JRES) -
Volume
95

Citation

Goodrich, L. and Srivastava, A. (1990), Software techniques to improve data reliability in superconductor and low-resistance measurements, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905872 (Accessed November 26, 2022)
Created October 1, 1990, Updated November 14, 2018