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Electronics

Electromagnetics

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Displaying 451 - 475 of 1580

The ARFTG Nonlinear Measurements Workshop and NVNA Users Forum

August 1, 2007
Author(s)
Kate Remley, Dominique Schreurs
This paper introduces readers to two informal meetings where microwave engineers can learn techniques, share experiences, and discuss the latest research in nonlinear and large-signal measurements. The Automatic RF Techniques Group ,ARFTG, Nonlinear

The Sampling Oscilloscope as a Microwave Instrument

August 1, 2007
Author(s)
Dylan Williams, Paul D. Hale, Kate Remley
Many modern high-speed oscilloscopes are well suited for precise microwave waveform, modulated-signal, and nonlinear measurements. These oscilloscopes have bandwidths of up to 100 GHz and are available with nominally 50 ? input impedances. Like their low

Evaluation of the electromagnetic penetration of the NASA space shuttle endeavour using an ultra wideband measurement system

July 8, 2007
Author(s)
Robert T. Johnk, Robert Scully, David R. Novotny, Chriss A. Grosvenor, Nino Canales, Dennis G. Camell, Galen H. Koepke
This paper summarizes a joint NIST-NASA measurement effort to evaluate the electromagnetic penetration of the shuttle Endeavour. NASA is concerned about the effects that microwave imaging radar systems might have on critical avionics systems on its fleet

Free Space Antenna Factors through the use of Time-Domain Signal Processing

July 8, 2007
Author(s)
Dennis G. Camell, Robert T. Johnk, David R. Novotny, Chriss A. Grosvenor
This paper demonstrates the usefulness of time domain processing to determine free-space antenna factors,FSAF, for EMC antennas. Procedures are explained and data is provided from 30 MHz to 9 GHz. We investigate time gating of dense frequency packed

Field-free ringing of nanomagnets

July 1, 2007
Author(s)
Thomas J. Silva
Ever since William Gilbert's 16th century treatise "De Magnete," it has been known that magnetic fields can be used to manipulate the magnetic orientation of ferromagnets. This has been the foundation for electronic applications of magnetic materials for

RFID Devices and Systems in Homeland Security Applications

July 1, 2007
Author(s)
Kate Remley, Jeffrey R. Guerrieri, Dylan Williams, David R. Novotny, Anthony B. Kos, Nelson Bryner, Nader Moayeri, Michael Souryal, Kang Lee, Steven Fick
This article reports on activities being carried out by the National Institute of Standards and Technology to ensure secure, reliable use of Radio-Frequency Identification (RFID) technology in homeland security and public safety applications. These

Delamination strength of YBCO coated conductors under transverse tensile stress

June 21, 2007
Author(s)
Daniel C. van der Laan, John (Jack) W. Ekin, Cameron C. Clickner, Theodore C. Stauffer
We present a new experimental technique to measure the delamination strength under transverse tensile stress of YBa 2Cu 3O 7-δ coated conductors for electric power applications. The delamination strength, defined as the tensile stress at which the ceramic

Near-field microwave microscope measurements to characterize bulk material properties

June 12, 2007
Author(s)
Atif A. Imtiaz, Thomas Baldwin, Hans T. Nembach, Thomas M. Wallis, Pavel Kabos
We measured bulk dielectric (Fused Silica), semiconductor (Silicon) and metal (Copper), with a Near-field Scanning Microwave Microscope (NSMM). We use three bulk materials to test the existing quasi-static theoretical approach to de-embed the materials

Inter-Laboratory Comparison of CMOS Distortion Measurements

June 8, 2007
Author(s)
Catherine A. Remley, Joe Gering, Susan L. Sweeney, C. Michael Olsen, Cliff Xie, Dave K. Walker, Tom McKay, John J. Pekarik
We describe an interlaboratory measurement comparison of distortion in a CMOS low-noise device operating under weakly nonlinear conditions. Issues that commonly arise in performing and interpreting nonlinear measurements are discussed, such as power vs

Broadband Characterization of Multilayer Dielectric Thin-Films

June 3, 2007
Author(s)
Nathan D. Orloff, Jordi Mateu, Makoto Murakami, Ichiro Takeuchi, James C. Booth
We develop a measurement technique for obtaining the broadband complex permittivity of thin-film dielectric materials over the frequency range from 100 Hz-40 GHz. Such broad frequency coverage can only be accomplishe3d by combining lumped-element and

An Empirical Model for the Warm-Up Drift of a Commercial Harmonic Phase Standard

June 1, 2007
Author(s)
Jeffrey Jargon, Jolene Splett, Dominic F. Vecchia, Donald C. DeGroot
We develop an empirical model for the warm-up drift in a harmonic phase standard used to calibrate the phase distortion of a nonlinear vector network analyzer. The model enables us to estimate the time at which the standard reaches stability.

Current Ripple Effect on n-Value

June 1, 2007
Author(s)
Loren F. Goodrich, Jolene Splett
We studied the systematic effect of current ripple on the determination of n-value, which is the index of the shape of the electric field-current (E-I) curve. Commercial Nb 3Sn wires were measured with controlled amounts of ac ripple. Substitution-box

Disorder effects on the intrinsic nonlinear current density in YBa2Cu3O7

June 1, 2007
Author(s)
Brian M. Andersen, James Booth, P.J. Hirschfeld
We present harmonic generation measurements of the intrinsic nonlinear current density j2 of (YBCO) films at temperatures close the Tc. Experiments on a range of different quality samples allow us to extract the dependence of j2 on the penetration depth of

Dielectric polarization evolution equations and relaxation times

May 25, 2007
Author(s)
James R. Baker-Jarvis, Billy F. Riddle, Michael D. Janezic
In this paper we develop a model that can describe broadband dielectric response, and includes frequency-dependent loss and the effects of the local electric field. The model is based on a correlation-function approach that we previously developed using
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