Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Evaluation of the electromagnetic penetration of the NASA space shuttle endeavour using an ultra wideband measurement system

Published

Author(s)

Robert T. Johnk, Robert Scully, David R. Novotny, Chriss A. Grosvenor, Nino Canales, Dennis G. Camell, Galen H. Koepke

Abstract

This paper summarizes a joint NIST-NASA measurement effort to evaluate the electromagnetic penetration of the shuttle Endeavour. NASA is concerned about the effects that microwave imaging radar systems might have on critical avionics systems on its fleet of space shuttles. As part of a multifaceted effort, a portable, NIST-developed ultra-wideband measurement system was deployed at the Kennedy Space Center to evaluate electromagnetic penetration in over the frequency range of 30 MHZ to 6 GHz at selected locations inside Endeavour. The measurements were carried out inside a large metal hangar, which exhibited robust reverberant behavior. A combination of reverb chamber techniques and time/frequency signal processing permitted the evaluation of electromagnetic penetration at six different locations inside the orbiter.
Conference Dates
July 8-13, 2007
Conference Location
Honolulu, HI, USA
Conference Title
IEEE International Symposium on EMC

Keywords

antenna, dual ridged horn, electromagnetic, frequency domain, hangar, NASA, NIST, orbiter, penetration, shielding, shuttle, tem horn, time domain, ultra wideband, VNA

Citation

Johnk, R. , Scully, R. , Novotny, D. , Grosvenor, C. , Canales, N. , Camell, D. and Koepke, G. (2007), Evaluation of the electromagnetic penetration of the NASA space shuttle endeavour using an ultra wideband measurement system, IEEE International Symposium on EMC, Honolulu, HI, USA (Accessed May 27, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 7, 2007, Updated October 12, 2021