Imtiaz, A.
, Baldwin, T.
, Nembach, H.
, Wallis, T.
and Kabos, P.
(2007),
Near-field microwave microscope measurements to characterize bulk material properties, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32646
(Accessed October 6, 2024)