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Electronics

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Displaying 26 - 50 of 690

On-Wafer Capacitor Characterization Including Uncertainty Estimates Up to 1.0 THz

July 19, 2024
Author(s)
Robert Jones, Jerome Cheron, Benjamin Jamroz, Dylan Williams, Ari Feldman, Peter Aaen, Christian Long, Nathan Orloff
In this article we extract the capacitance of shunt and series metal-insulator-metal capacitors from on-wafer S-parameter measurements in the WR1.0 waveguide band. We verify consistency of the measured devices in two different state-of-the-art terahertz

A 0.1 GHz to 1.1 THz Inverted Grounded-CPW mTRL Calibration Kit Characterization in an InP HBT Process

May 13, 2024
Author(s)
Jerome Cheron, Rob Jones, Dylan Williams, Miguel Urteaga, Bryan Bosworth, Nick Jungwirth, Jeffrey Jargon, Ben Jamroz, Chris Long, Nate Orloff, Ari Feldman, Peter Aaen
We report a novel design approach of on-wafer multiline thru-reflect-line (mTRL) calibration kit fabricated on a commercial semiconductor-based transistor process that we validate from 0.1 GHz to 1.1 THz. The on-wafer calibration standards are designed

Optical frequency division & pulse synchronization using a photonic-crystal microcomb injected chip-scale mode-locked laser

February 15, 2024
Author(s)
Chinmay Shirpurkar, Jizhao Zang, Ricardo Bustos-Ramirez, David Carlson, Travis Briles, Lawrence R. Trask, Srinivas V. Pericherla, Di Huang, Ashish Bhardwaj, Gloria E. Hoefler, Scott Papp, Peter J. Delfyett
A mode-locked laser photonic integrated circuit with a repetition rate of 10 GHz is optically synchronized to a tantalabased photonic crystal resonator comb with a repetition rate of 200 GHz. The synchronization is achieved through regenerative harmonic

Heart-on-a-Chip Systems: Disease Modeling and Drug Screening Applications

February 14, 2024
Author(s)
Derrick Butler, Darwin Reyes-Hernandez
Cardiovascular disease (CVD) is the leading cause of death worldwide, casting a substantial economic footprint and burdening the global healthcare system. Historically, pre-clinical CVD modeling and therapeutic screening has been performed using animal

Advancing Measurement Science for Microelectronics: CHIPS R&D Metrology Program

February 13, 2024
Author(s)
Marla L. Dowell, Hannah Brown, Gretchen Greene, Paul D. Hale, Brian Hoskins, Sarah Hughes, Bob R. Keller, R Joseph Kline, June W. Lau, Jeff Shainline
The CHIPS and Science Act of 2022 called for NIST to "carry out a microelectronics research program to enable advances and breakthroughs....that will accelerate the underlying R&D for metrology of next-generation microelectronics and ensure the

Josephson Sampler Response using a Binary Search Algorithm

January 19, 2024
Author(s)
BART VAN ZEGHBROECK, Logan Howe, Pete Hopkins
This paper presents the use of a binary search algorithm to obtain the simulated response of a superconducting Josephson junction-based sampler. In the absence of noise, this simple approach is superior to mimicking the experimental approach of using an

SHINERS Study of Chloride Order-Disorder Phase Transition and Solvation of Cu(100)

January 3, 2024
Author(s)
Thomas P. Moffat, David Raciti, Angela R. Hight Walker, Eric J. Cockayne, John Vinson, Kathleen Schwarz
Shell-isolated Nanoparticle Enhance Raman Spectroscopy (SHINERS) and Density Functional Theory (DFT) are used to probe Cl- adsorption and the order-disorder phase transition associated with the c(2×2) Cl- adlayer on Cu(100) in acid media. A two-component 

A Fully Integrated, Automatically Generated DC-DC Converter Maintaining > 75% Efficiency From 398 K Down to 23 K Across Wide Load Ranges in 12-nm FinFET

January 1, 2024
Author(s)
Anhang Li, Jeongsup Lee, Prashansa Mukim, Brian Hoskins, Pragya Shrestha, David Wentzloff, David Blaauw, Dennis Sylvester, Mehdi Saligane
This paper presents a fully integrated recursive successive-approximation switched capacitor (RSC) DC-DC converter implemented using an automatic cell-based layout generation in 12 nm FinFET technology. A novel design methodology is demonstrated based on

Ultra-Low Phase Noise Frequency Division with Array of Direct Digital Synthesizers

December 25, 2023
Author(s)
Marco Pomponio, Archita Hati, Craig Nelson
In this article, we present a four-channel direct digital synthesis (DDS) design that operates with a common clock ranging from 500 MHz to 24 GHz and generates output frequencies up to 1.75 GHz. A key feature of this board is its custom field-programmable

Picoliter Drop Deposition of SnO2 Nanoparticles onto Microsensor Platforms

December 14, 2023
Author(s)
Elvin Beach, Kurt D. Benkstein, Krenar Shqau, Christopher Montgomery, Patricia Morris, Stephen Semancik
Microhotplates produced by micromachining processes provide a robust substrate for miniaturized solid-state gas sensors; however, it can be challenging to locally deposit solution-suspended nanomaterials for sensing directly onto these small (≈ 100 µm), 3

INTERNATIONAL ROADMAP FOR DEVICES AND SYSTEMSTM 2023 EDITION METROLOGY

December 8, 2023
Author(s)
Elisabeth Mansfield, Bryan Barnes, R Joseph Kline, Andras E. Vladar, Yaw S. Obeng, Albert Davydov
The Metrology Chapter identifies emerging measurement challenges from devices, systems, and integration of new materials in the semiconductor industry and describes research and development pathways for meeting them. This includes but not limited to

Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz

November 15, 2023
Author(s)
Rob Jones, Jerome Cheron, Bryan Bosworth, Ben Jamroz, Dylan Williams, Miguel Urteaga, Ari Feldman, Peter Aaen
In this paper, we investigate the effect of two calibration errors, probe placement and capacitance per unit length, on transistor characterization from 220 GHz to 325 GHz on both a microstrip and an inverted coplanar waveguide with a via stitched ground

NIST's Antenna Gain and Polarization Calibration Service Reinstatement

October 9, 2023
Author(s)
Josh Gordon, Benjamin Moser
After a five-year renovation of the National Institute of Standards and Technology (NIST) Boulder, CO, antenna measurement facility, the Antenna On-Axis Gain and Polarization Measurements Service SKU63100S was reinstated with the Bureau International des

Broadband Electromagnetic Properties of Engineered Flexible Absorber Materials

August 23, 2023
Author(s)
Luckshitha Suriyasena Liyanage, Connor Smith, Jacob Pawlik, Sarah Evans, Angela Stelson, Chris Long, Nate Orloff, David Arnold, Jim Booth
Flexible and stretchable materials have attracted significant interest for applications in wearable electronics and bioengineering fields. Recent developments also incorporate embedded microwave circuits, components, and systems with engineered flexible

National Institute of Standards and Technology Environmental Scan 2023: Societal and Technology Landscape to Inform Science and Technology Research

August 23, 2023
Author(s)
Ashley Russell, Kerrianne Buchanan, David Griffith, Heather Evans, Dimitrios Meritis, Lisa Ng, Anna Sberegaeva, Michelle Stephens
The 2023 National Institute of Standards and Technology Environmental Scan provides an analysis of key external factors that could impact NIST and the fulfillment of its mission in coming years. The analyses were conducted through three separate lenses
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