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Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz

Published

Author(s)

Rob Jones, Jerome Cheron, Bryan Bosworth, Ben Jamroz, Dylan Williams, Miguel Urteaga, Ari Feldman, Peter Aaen

Abstract

In this paper, we investigate the effect of two calibration errors, probe placement and capacitance per unit length, on transistor characterization from 220 GHz to 325 GHz on both a microstrip and an inverted coplanar waveguide with a via stitched ground plane (CPW-G) calibration kit. We find the capacitance per unit length errors are greater for the microstrip calibration than for the CPW-G calibration. These findings have critical ramifications for transistor characterization and modelling, and active circuit design.
Conference Dates
October 15-18, 2023
Conference Location
Monterey, CA, US
Conference Title
2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)

Keywords

calibration, on-wafer, uncertainty, microstrip, coplanar waveguide, HBT, common emitter, common base

Citation

Jones, R. , Cheron, J. , Bosworth, B. , Jamroz, B. , Williams, D. , Urteaga, M. , Feldman, A. and Aaen, P. (2023), Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz, 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), Monterey, CA, US, [online], https://doi.org/10.1109/BCICTS54660.2023.10310853, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956190 (Accessed June 17, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 15, 2023, Updated November 27, 2023