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A new standard for the calibration of refractometers has been developed. Standard Reference Material (SRM) 1922 is a mineral oil with a refractive index n D=1.46945 at 20 C, which is within the range of the Brix scale (% sucrose). The change in index with
G Ramanath, J E. Greene, I Petrov, J E. Baker, L H. Allen, J Greg Gillen
Asymmetric depth profiles of elemental and molecular secondary ions are observed during secondary ion mass spectrometry (SIMS) analyses of polycrystalline-TiN/Ti/TiN(001) trilayers using a Cs+ ion beam. The sputter-etching rate R and the secondary ion
Phosphor imaging plate technology has made it possible to directly image the distribution of primary beam electrons and scattered electrons in the environmental scanning electron microscope. The phosphor plate is exposed under electron scattering
The U.S. Federal Government has a strong role in metrology R&D in the U.S because of its importance to the nation's economy and the Constitutional authority given to the National Institute of Standards and Technology (NIST). However, pressures to maintain
The binary-encounter-Bethe (BEB) model for calculating electron-impact ionization cross sections for molecules is described with emphasis on polyatomic molecules and their radicals and ions. The BEB model provides an analytic formula for the cross section
The Fano-Anderson model for a discrete state embedded within a continuum is revisited within the context of excitation and decay processes which lead to some manifestations of Fano lineshape profiles. The phenomenon of resonance tunneling between an STM
This report summarizes the research and services provided by the Chemical Science and Technology Laboratory of the National Institute of Standards and Technology for Fiscal Year 1999. The report includes: a general overview of the laboratory's activities
We have performed an evaluation of calculated and measured electron inelastic mean free paths (IMFPs) for selected materials and for electron energies between 50 eV and 10,000 eV. This evaluation is based on IMFPs calculated from experimental optical data
The extended corresponding states (ECS) model of Huber et al. (Huber, M.L., Friend, D.G., Ely, J.F. Prediction of the thermal conductivity of refrigerants and refrigerant mixtures.
The structure of ultrathin silicon oxynitride films, used as gate dielectrics in integrated circuits (ICs), is studied using analytical electron microscopy (AEM). Laterally homogeneous blanket films approximately 2nm in thickness are characterized in cross
Willie E. May, Reenie M. Parris, C. M. Beck II, John D. Fassett, Robert R. Greenberg, Franklin R. Guenther, Gary W. Kramer, Stephen A. Wise, T E. Gills, R J. Gettings, Bruce S. MacDonald
J H. Scott, Eric S. Windsor, D Brady, J Canterbury, A. Karamcheti, W Chism, A C. Diebold
Silicon Oxynitride blanket films approximately 2 n min thickness are characterized in cross section using a 300 keV TEM/STEM. High resolution imaging is used to investigate the accuracy and precision of TEM film thickness measurements and their
Ryna B. Marinenko, Jennifer R. Verkouteren, David S. Bright
The use of digital electron microprobe x-ray compositional mapping using wavelength dispersive spectrometers to understand the microstructure of yttria stabilized zirconia thermal barrier coatings is described. Data from quantification fo element x-ray
A practical representation for the transport coefficients of pure refrigerants R32, R125, R134a, and R125 + R32 mixtures is presented which is valid in the vapor-liquid critical region.
Dale E. Newbury, David A. Wollman, Kent D. Irwin, Gene C. Hilton, John M. Martinis
The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV for photon energies below 2 keV, the wide photon energy coverage, 250 eV to 10 keV, and the