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NIST Authors in Bold

Displaying 36026 - 36050 of 74066

Unbiased Estimation of Linewidth Roughness

May 1, 2005
Author(s)
John S. Villarrubia, B Bunday
Line width roughness (LWR) is usually estimated simply as three standard deviations of the line width. The effect of image noise upon this metric includes a positive nonrandom component. The metric is therefore subject to a bias or ?systematic error? that

Uncertainty in Reference Values for the Charpy V-notch Verification Program

May 1, 2005
Author(s)
Jolene D. Splett, Chih-Ming Wang
We present a method for computing the combined standard uncertainty for reference values used in the Charpy machine verification program administered by the National Institute of Standards and Technology. The technique is compliant with the ISO GUM and

Voluntary Voting System Guidelines

May 1, 2005
Author(s)
Mark Skall
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and publishes file profiles computed from this software (such as MD5 and SHA-1 hashes) as a Reference

Wavelet-Based Enveloping for Spindle Health Diagnosis

May 1, 2005
Author(s)
Li Zhang, Robert Gao, Kang B. Lee
A new method for identifying structural defect-induced vibration signals was developed based on the analytic wavelet transform. The advantage of this method is that it extracts defect-related impulse signal and constructs its envelope in a single step

Ventilation Design and Performance in U.S. Office Buildings

April 30, 2005
Author(s)
Andrew K. Persily, J Gorfain
Building ventilation is a primary determinant of indoor air quality (IAQ) as it impacts contaminant concentrations and occupant comfort in terms of the perception of odor and irritation. However, relatively few measurements of office building ventilation

Importance of Display Metrology in a Competitive World

April 26, 2005
Author(s)
Edward F. Kelley
How do contrast, brightness, viewing angle, and other parameters affect the quality of a display? Do the specifications always tell you what you want to know? Is specsmanship a problem? Why is a solid bedrock of display metrology important for the highly

Pump-probe Faraday rotation magnetometer using two diode lasers

April 26, 2005
Author(s)
Forrest T. Charnock, Radek Lopusnik, Thomas J. Silva
A time-resolved Faraday rotation magnetometer using externally triggered pulsed diode lasers is described. This device permits measurement of the dynamic properties of polarized electronic spins in semiconductors. A non- equilibrium spin polarization is

Optical frequency / wavelentgh references

April 25, 2005
Author(s)
Leo W. Hollberg, Christopher W. Oates, G Wilpers, C Hoyt, Zeb Barber, Scott A. Diddams, W Oskay, James C. Bergquist
Ideas for using visible light from atomic transitions for precision instrumentation and metrology go back at least to the 1800's. There are several good reasons to use optical frequencies, and with the scientific and technological advances of the last

Mobility Open Architecture Simulation and Tools Environment

April 21, 2005
Author(s)
Stephen B. Balakirsky, Christopher J. Scrapper Jr, Elena R. Messina
This paper will describe the Mobility Open Architecture Tools and Simulation (MOAST) environment. This environment conforms to the NIST 4D/RCS architecture [3] and allows simulated and real architectural components to function seamlessly in the same system
Displaying 36026 - 36050 of 74066