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NIST Pubs

NIST Mechanisms for Disseminating Measurements

January 1, 2001

Author(s)

T E. Gills, S Dittmann, Georgia L. Harris, C S. Brickenkamp, J R. Rumble, N M. Trahey

The National Bureau of Standards, predecessor of the National Institute of Standards and Technology, began providing the Nation with measurement artifacts and

Opto-mechanical and electronic design of a tunnel-trap Si-radiometer

January 1, 2001

Author(s)

George P. Eppeldauer, D C. Lynch

Therapeutic and Drug Delivery Devices

January 1, 2001

Author(s)

Lisa R. Karam, M Coursey b

Common Biometric Exchange File Format (CBEFF)

January 1, 2001

Author(s)

Fernando L. Podio, J S. Dunn, L Reinert, C J. Tilton, L O'Gorman, P Collier, Mark Jerde, B Wirtz

Common Biometric Exchange File Format (CBEFF) describes a set of data elements necessary to support biometric technologies in a common way. These data can be

Acceptance of new batches of 9310 steel for the Charpy Machine Verification Program

January 1, 2001

Author(s)

May Ling Martin, Enrico Lucon

During FY2021, one of the NIST Charpy Contractors returned some 9310 steel blanks (rough-machined, oversized, unnotched specimens) that presented visible black

Limits for Qualitative Detection and Quantitative Determination in A Century of Excellence in Measurements, Standards, and Technology - A Chronicle of Selected NBS/NIST Publications, 1901-2000

January 1, 2001

Author(s)

Richard M. Lindstrom

Perspectives on the Needs for Biomedical Materials and Device Standards

January 1, 2001

Author(s)

Lisa R. Karam, D S. Hall, J A. Tesk

Thermal Spray Process Reliability: Sensors and Diagnostics; Summary of a Workshop held at National Institute of Standards and Technology

January 1, 2001

Author(s)

Stephen D. Ridder

This report covers the second workshop on TS coatings sponsored by the NIST Metallurgy Division. The first of these workshops, held in November, 1998, is

Use of Fluorescence to Measure the Lubricant Excess Surface Density During Pool Boiling

January 1, 2001

Author(s)

Mark A. Kedzierski

This paper presents what are believed to be the first measurements of the non-adiabatic lubricant excess surface density on a roughened, horizontal flat pool

Needs for Radioactivity Standards and Measurements in Different Fields, ed. by D.R. Lide

January 1, 2001

Author(s)

Bert M. Coursey

Guide to Rheological Nomenclature: Measurement in Ceramic Particulate Systems

January 1, 2001

Author(s)

Vincent A. Hackley, Chiara F. Ferraris

This document provides definitions of terms and expressions relating to the measurement of rheological properties in liquid-based ceramic particulate systems (i

Input Data for Multizone Airflow and IAQ Analysis

January 1, 2001

Author(s)

Andrew K. Persily, E M. Ivy

The use of multizone airflow and contaminant dispersal models requires a range of data. In terms of airflow analysis, these data include leakage characteristics

Atomic Energy Levels and Other Spectroscopic Data

January 1, 2001

Author(s)

Wolfgang L. Wiese

Metallurgy Division 2000 Programs and Accomplishments

January 1, 2001

Author(s)

C A. Handwerker, Robert J. Schaefer

This report describes major programs and accomplishments of the Metallurgy Division of the NIST Materials Science and Engineering Laboratory (MSEL) in FY2000

Precision Ultrasonic Wave Measurements with Simple Equipment

January 1, 2001

Author(s)

Steven E. Fick, C H. Palmer

We describe the design and construction of a relatively simple, inexpensive laser interferometer system for accurate measurements of ultrasonic waveforms in

CODATA Recommended Values of the Fundamental Constants of Physics and Chemistry

January 1, 2001

Author(s)

Peter J. Mohr, Barry N. Taylor

Materials Reliability Division FY 2000 Programs and Accomplishments

January 1, 2001

Author(s)

F R. Fickett

The technical activities of the Materials Reliability Division during fiscal year 2000 are summarized. The Division has 23 research projects in the following

Transfer Calibration Validation Tests on a Heat Flux Sensor in the 51 mm High-Temperature Blackbody

January 1, 2001

Author(s)

A V. Murthy, Benjamin K. Tsai, Robert D. Saunders

Wafer Level Underfill: Experiments and Modeling.

January 1, 2001

Author(s)

Daniel Josell, William E. Wallace, Daniel Wheeler

MSIDs Continuous Improvement Activities

January 1, 2001

Author(s)

Sharon J. Kemmerer, Kristy D. Thompson

The purpose of this document is to provide status on two continuous improvement projects internal to the National Institute of Standards and Technology (NIST)

Submicrometer Linewidth Metrology

January 1, 2001

Author(s)

Michael T. Postek, Robert D. Larrabee

Office of Microelectronics Programs Technical Accomplishments

January 1, 2001

Author(s)

Stephen Knight, Barbara J. Belzer

This document represents the fiscal year 2000 production of the Programs comprising the Office of Microelectronics Programs (OMP).

A Pratical Josephson Voltage Standard at One Volt

January 1, 2001

Author(s)

Yi-hua D. Tang, Norman B. Belecki, J F. Mayo-Wells

Computational and Performance Aspects of PCA-Based Face Recognition Algorithms

January 1, 2001

Author(s)

H Moon, P. Jonathon Phillips

Principal component analysis (PCA) based algorithms form the basis of numerous algorithms and studies in the psychological and algorithmic face recognition

Rationale and Procedures for Development of a NASA Primary Metrology Laboratory for Large Optics

January 1, 2001

Author(s)

Theodore V. Vorburger, Christopher J. Evans, William T. Estler

Traceable optics metrology is not an expensive overhead. Rather it can improve NASA''s procurement process and eliminate costly Hubble-like mistakes. In

The Ampere and Electrical Standards

January 1, 2001

Author(s)

Randolph Elmquist, Marvin E. Cage, Yi-hua D. Tang, Anne-Marie Jeffery, Joseph R. Kinard Jr., Ronald F. Dziuba, Nile M. Oldham, Edwin R. Williams

This paper describes some of the major contributions to metrology and physics made by the NIST Electricity Division, which has existed since 1901. It was one of

Electron Interactions with c-C₄F₈

January 1, 2001

Author(s)

Loucas G. Christophorou, James K. Olthoff

The limited electron collision cross-section and transport-coefficient data for the plasma processing gas perfluorocyclobutane (c-C 4F 8) are synthesized

NIST Centenial Sessions August Second Two Thousand and One

January 1, 2001

Author(s)

W Anderson, Dennis A. Swyt, H Semerjian

The National Conference of Standards Laboratories International was formed in forty years ago (as NCSL) to promote cooperative efforts for solving the common

Electronics and Electrical Engineering Laboratory, Magnetics Group: Programs, Activities, and Accomplishments

December 31, 2000

Author(s)

Ronald B. Goldfarb

Report of the NIST MEL Architecture Task Force

December 29, 2000

Author(s)

Harry A. Scott, John Evans, Steven R. Ray, E C. Teague, James S. Albus, Herbert T. Bandy, Edward J. Barkmeyer Jr., Neil Christopher, M A. Donmez, Hui-Min Huang, Albert W. Jones, Elena R. Messina, Jim G. Nell, Frederick M. Proctor, Evan K. Wallace

The NIST Manufacturing Engineering Laboratory undertook a series of internal working meetings to examine all of its architecture efforts. A survey of work was

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