Knight, S.
and Belzer, B.
(2001),
Office of Microelectronics Programs Technical Accomplishments, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed September 8, 2024)
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Office of Microelectronics Programs Technical Accomplishments
Published
Author(s)
,
Abstract
This document represents the fiscal year 2000 production of the Programs comprising the Office of Microelectronics Programs (OMP).Citation
NIST Interagency/Internal Report (NISTIR) - 6707
Report Number
6707
NIST Pub Series
Pub Type
NIST Pubs
Keywords
semiconductor, microelectronic, metrology, technology, microscopy, materials, reference
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 2000, Updated October 12, 2021