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Office of Microelectronics Programs Technical Accomplishments

Published

Author(s)

Stephen Knight, Barbara J. Belzer

Abstract

This document represents the fiscal year 2000 production of the Programs comprising the Office of Microelectronics Programs (OMP).
Citation
NIST Interagency/Internal Report (NISTIR) - 6707
Report Number
6707

Keywords

semiconductor, microelectronic, metrology, technology, microscopy, materials, reference

Citation

Knight, S. and Belzer, B. (2001), Office of Microelectronics Programs Technical Accomplishments, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed May 28, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2000, Updated October 12, 2021