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Marcia L. Huber, Arno D. Laesecke, Daniel G. Friend
In this report, we review the available measurements of the vapor pressure of mercury and develop a new correlation for the vapor pressure of mercury that is
Kristine A. Bertness, Todd E. Harvey, C. M. Wang, Albert J. Paul, Larry Robins
Standard Reference Materials (SRMs) 2840 to 2843 are semiconductor material artifacts that consist of an epitaxial layer of AlxGa (1-x)As on a GaAs substrate
This front matter for a special issue of the NIST Journal of Research contains a photograph and biography of Christoph Witzgall. It also contains a thank you
We begin this expository essay by reviewing with examples what a typical engineer already knows about statistics. We then consider a central question in
A scheme is presented and software is documented for representing as integers input decimal numbers that have been stored in a computer as double precision
This bulletin provides information on the applicability and implementation of FIPS 200, Minimum Security Requirements for Federal Information and Information
Vincent M. Stanford, C. Rochet, Martial Michel, John S. Garofolo
Properly designed reference data and performance metrics can offer crucial aid to developers of advanced statistical recognition technologies. We focus here on
Patrick Grother, R. McCabe, Craig I. Watson, Michael D. Indovina, Wayne J. Salamon, Patricia A. Flanagan, Elham Tabassi, Elaine M. Newton, Charles L. Wilson
While the interchange of fingerprint image data provides the greatest interoperability between dissimilar fingerprint recognition systems, standards exist that
We survey three ways to multiply elements of the additive subgroup of the group of real--valued functions on Rd which is generated by the indicator functions of
The Building and Fire Research Laboratory (BFRL) at the National Institute of Standards and Technology (NIST) is the nation's primary resource for measurements
National Institute of Standards and Technology (NIST), Ronald S. Ross, Stuart W. Katzke, L A. Johnson
FIPS 200 is the second standard that was specified by the Federal Information Security Management Act (FISMA). It is an integral part of the risk management
The use of mobile handheld devices within the workplace is expanding rapidly. These devices are no longer viewed as coveted gadgets for early technology
This is the biennial report for 2004-2005 for the Building and Fire Research Laboratory (BFRL) at the National Institute of Standards and Technology (NIST), an
The nation?s emergency responders need to work in a coordinated, well-planned manner to best mitigate the impact of an emergency incident. They need to be
This report describes review of DoD military fixed-wing and rotary aircraft fire mishap/incident data applicable to assess temperatures at which aircraft fire
The NIST Handbook 150 publication series sets forth the procedures, requirements, and guidance for the accreditation of testing and calibration laboratories by
The objective of system security planning is to improve protection of information system resources. All federal systems have some level of sensitivity and
This bulletin provides information for organizational security managers who are responsible for designing and implementing security patch and vulnerability
P J. Phillips, P J. Flynn, W T. Scruggs, K W. Bowyer, W Worek
The goal of the Face Recognition Grand Challenge (FRGC) is to improve the performance of face recognition algorithms by an order of magnitude over the best
This report covers the work conducted within the National Institute of Standards and Technology's Computer Security Division during the Fiscal Year 2005. It
Dianne L. Poster, Michele M. Schantz, Stephen A. Wise
A new reference material (RM), RM 8504, has been prepared for use as a diluent oil with Aroclors in transformer oil Standard Reference Materials (SRMs) 3075
One of the best approaches for maintaining uniform temperature across a machine tool structure thus minimizing thermal deformations is removing the heat at the
Emre Yarimbiyik, Harry A. Schafft, Richard A. Allen, Mona Zahgoul, David L. Blackburn
A highly versatile simulation program was developed and used to examine how the resistivity of thin metal films and lines is increased as their dimensions
This is the proceedings of a workshop held on November 7 and 8, 2005 in Long Beach, California, USA, hosted by the Software Diagnostics and Conformance Testing