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NIST Pubs

NIST Measurement Services: Specular Gloss

Author(s)
Maria E. Nadal, E A. Early, E A. Thompson
This document describes the instrumentation, standards, and measurement techniques used at the National Institute of Standards and Technology (NIST) to measure

An Examination of New Paradigms for Spline Approximations

Author(s)
Christoph J. Witzgall, David E. Gilsinn, Marjorie A. McClain
Lavery splines are examined in the univariate and bivariate cases. In both instances relaxation based algorithms for approximate calculation of Lavery splines

RM 8111: Development of a Prototype Linewidth Standard

Author(s)
Michael W. Cresswell, William Gutherie, R. Dixon, Richard A. Allen, Christine E. Murabito, Joaquin (. Martinez
Staff of the Semiconductor Electronics Division, the Information Technology Laboratory, and the Precision Engineering Laboratory at NIST, in collaboration with

Evaluating Reasoning Systems

Author(s)
Conrad Bock, Michael Gruninger, Donald E. Libes, Joshua Lubell, Eswaran Subrahmanian
A review of the literature on evaluating reasoning systems reveals that it is a very broad area with wide variation in depth and breadth of research on metrics

Engineered Infills for Concrete Barriers

Author(s)
Kenneth A. Snyder, C Langton, B Clark, Chiara C. Ferraris, J Dawson
Entombment may be considered as an option for decommissioning nuclear concrete structures so that licenses for facilities on which these structures reside may

Composition Standards for AlGaAs Epitaxial Layers

Author(s)
Kristine A. Bertness, Todd E. Harvey, C. M. Wang, Albert J. Paul, Larry Robins
Standard Reference Materials (SRMs) 2840 to 2843 are semiconductor material artifacts that consist of an epitaxial layer of AlxGa (1-x)As on a GaAs substrate
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