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NIST Pubs

Semiconductor Microelectornics and Nanoelectronics Programs

Author(s)
Stephen Knight, Joaquin (. Martinez, Michele L. Buckley
The microelectronics industry supplies vital components to the electronics industry and to the U.S. economy, enabling rapid improvements in productivity and in

Proceedings of the Static Analysis Summit

Author(s)
Paul E. Black, Helen Gill, W. E. Martin, Elizabeth N. Fong
This is the proceeding of a summit held in June 2006 at the National Institute of Standards and Technology (NIST). This Static Analysis Summit is one of a

Certification of SRM 114q: Part II

Author(s)
Chiara F. Ferraris, Max A. Peltz, William F. Guthrie, A Aviles, Robin K. Haupt, Bruce S. MacDonald
The standard reference material (SRM) for fineness of cement, SRM 114, is an integral part of the calibration material routinely used in the cement industry to

Certification of SRM 114q: Part I

Author(s)
Chiara F. Ferraris, William F. Guthrie, A Aviles, Robin K. Haupt, Bruce S. MacDonald
The standard reference material (SRM) for fineness of cement, SRM 114, is an integral part of the calibration material routinely used in the cement industry to
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