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Journals

Industrial Uses of STM and AFM

January 1, 1997

Author(s)

Theodore V. Vorburger, John A. Dagata, G. Wilkening, K Iizuka

We review the field of STM and AFM as applied to industrial problems, and we classify the applications into four classes: research with potential benefit to...

Hybrid Optical-Electrical Overlay Test Structure

January 1, 1997

Author(s)

Michael W. Cresswell, Robert Allen, L Linholm, William F. Guthrie, William B. Penzes, A Gurnell

This paper describes the exploratory use of electrical test structures to enable the calibration of optical overlay instruments of the type used to monitor...

A Differential Wavelength Meter for Laser Tuning

January 1, 1997

Author(s)

Lowell P. Howard, Jack A. Stone Jr.

A simple interferometer for matching the wavelengths of tunable lasers is described. Our interferometer uses the angular dispersion of a diffraction grating at...

Short-Duration Autoignition Temperature Measurements for Hydrocarbon Fuels Near Heated Metal Surfaces

January 1, 1997

Author(s)

K C. Smyth, Nelson P. Bryner

An apparatus has been designed, built, and extensivley tested for making short-duration autoignition temperature measurements of hydrocarbon fuels under...

Radiative Emission Fraction of Pool Fires Burning Silicone Fluids

January 1, 1997

Author(s)

R Buch, Anthony Hamins, K Konishi, D. Mattingly, Takashi Kashiwagi

The steady-state mass burning flux and the radiative flux profiles to the surroundings were measured for a series of burning silicone fluids and organic fuels...

Optical and Electrical Characterization of Bacteriorhodopsin Films

January 1, 1997

Author(s)

T Dyukova, B Robertson, H H. Weetall

Subatmospheric Vapor Pressures Evaluated from Internal-Energy Measurements

January 1, 1997

Author(s)

H Duarte, Joe W. Magee

A Pulse Generator Simulating Ge-Detector Signals for Dead-Time and Pile-Up Correction in Gamma-Ray Spectrometry in INAA Without Distortion of the Detector Spectrum

January 1, 1997

Author(s)

S S. Then, F D. Geurink, Peter Bode, Richard M. Lindstrom

High Resolution Imaging of Thin-film Recording Heads by Superparamagnetic Magnetic Force Microscopy Tips

January 1, 1997

Author(s)

Sy-Hwang Liou, S S. Malhotra, John M. Moreland, P F. Hopkins

Finish Hard Turning of Powder Metallurgy M50 Steel

January 1, 1997

Author(s)

Y K. Chou, Christopher J. Evans

Finishing performance in turning of hardened powder metallurgy (PM) AISI M50 steel using cubic boron nitride (CBN) tools has been studied. Tool wear and flank...

White Layers and Thermal Modeling of Hard Turned Surfaces

January 1, 1997

Author(s)

Y K. Chou, Christopher J. Evans

White layers in hard turned surfaces are identified, characterized and measured as a function of tool flank wear and cutting speed. White layer depth generally...

Distributions of Measurement Errors for Single-Axis Magnetic Field Meters During Measurements Near Appliances

January 1, 1997

Author(s)

Martin Misakian, Charles D. Fenimore

Characterization of Fiber-Waviness in Composite Specimens Using Deep Line-Focus Acoustic Microscopy

January 1, 1997

Author(s)

W Sachse, D Xiang, Nelson N. Hsu, K Y. Kim

A broadband lensless, line-focus transducer possessing a large aperture and low f-number can be used to generate leaky surface waves in a specimen. It is a...

Statistical Error Analysis of Time and Polarization Resolved Ultrasonic Measurements

January 1, 1997

Author(s)

D Xiang, Gerald V. Blessing, Nelson N. Hsu

The time and polarization resolved ultrasonic technique which we previously developed has been demon-strated to simultaneously provide measurements of the wave...

Spatial Resolution with Time-and-Polarization-Resolved Acoustic Microscopy

January 1, 1997

Author(s)

D Xiang, Gerald V. Blessing, Nelson N. Hsu

We have developed a time-and-polarization-resolved acoustic microscopy technique to determine material properties of solids immersed in water. At the heart of...

Local Characterization of Transmission Properties of a Two-Dimensional Photonic Crystal

January 1, 1997

Author(s)

E B. Mcdaniel, Julia W. Hsu, Lori S. Goldner, R J. Tonucci, Eric L. Shirley, Garnett W. Bryant

Hot-Electron-Microcalorimeters with 0.25 mm² Area

December 31, 1996

Author(s)

John M. Martinis

Hot-Electron-Microcalorimeters with 0.25 mm2 Area

December 31, 1996

Author(s)

John M. Martinis

Monte Carlo Simulation of Scanning Electron Microscope Signals for Lithographic Metrology

December 31, 1996

Author(s)

J R. Lowney

Application of Monte Carlo Simulations to Critical Dimension Metrology in a SEM

December 31, 1996

Author(s)

J R. Lowney

On Using Collocation in Three Dimensions and Solving a Model Semiconductor Problem, Application of the Collocation Method in Three Dimensions to a Model Semiconductor Problem

December 31, 1996

Author(s)

Jay F. Marchiando

On Calculating the Reflectance and Transmittance of Light for a Simple Thick Grating Structure

December 31, 1996

Author(s)

Jay F. Marchiando

Recent Developments in Electrical Linewidth and Overlay Metrology for Integrated Circuit Fabrication Processes

December 31, 1996

Author(s)

Michael W. Cresswell, J. J. Sniegowski, Rathindra Ghoshtagore, Richard A. Allen, William F. Guthrie, A. W. Gurnell, Loren W. Linholm, E C. Teague

Hot-electron Microcalorimeter for X-ray Detection Using a Superconducting Transition Edge Sensor with Electrothermal Feedback

December 31, 1996

Author(s)

Kent D. Irwin, Gene C. Hilton, John M. Martinis, B. Cabrera

Determination of Densities and Mobilities of Heavy and Light Holes in P-Type Si Using Reduced-Conductivity-Tensor Analyses of Magnetic-Field Dependent Hall and Resistivity Measurements

December 31, 1996

Author(s)

Jin S. Kim, David G. Seiler, James R. Ehrstein

Characterization of Time-Dependent Dielectric Breakdown in Intrinsic Thin SiO₂

December 31, 1996

Author(s)

John S. Suehle, P Chaparala

Electrical Characterization of Very-Narrow-Gap Bulk HgCdTe Single Crystals by Variable Magnetic-Field-Hall Measurements

December 31, 1996

Author(s)

Jin S. Kim, David G. Seiler, R. A. Lancaster, M. B. Reine

Vertical-Cavity Surface-Emitting Lasers with Low-Ripple Optical Pump Bands

December 23, 1996

Author(s)

K. J. Knopp, David H. Christensen, J. R. Hill

Z-propagating waveguide lasers in rare-earth-doped Ti:LiNbO₃

December 16, 1996

Author(s)

J. Amin, J. A. Aust, Norman Sanford

A means of reproducibly fabricating stable cw lasers in rare-earth-doped Ti:LiNb0 3 has been demonstrated through judicious choice of waveguide orientation. Z...

Is Your Scanning Electron Microscope Hi-Fi?

December 7, 1996

Author(s)

Andras Vladar, Michael T. Postek, S Davilla

The scanning electron microscope (SEM) historically has been used mainly as an image-producing device and, in spite of certain obvious and sometimes serious...

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