Vorburger, T.
, Dagata, J.
, Wilkening, G.
and Iizuka, K.
(1997),
Industrial Uses of STM and AFM, Annals CIRP
(Accessed January 16, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Industrial Uses of STM and AFM
Published
Author(s)
, , G. Wilkening, K Iizuka
Abstract
We review the field of STM and AFM as applied to industrial problems, and we classify the applications into four classes: research with potential benefit to industry, research performed by industry, applications off-line in manufacturing, and applications on-line in manufacturing. We also discuss the role of metrology for certain applications and briefly review many other types of SPMs besides STM and AFM. We conclude by emphasizing ultra-precision positioning, nanofabrication, and biomedical applications as important future directions in the field.Citation
Annals CIRP
Volume
47(2)
Pub Type
Journals
Keywords
atomic force microscopy (AFM), Scanning probe microscopy (SPM), Scanning tunneling microscopy (STM)
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1996, Updated October 12, 2021