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Journals

Radiationless Resonant Raman Scattering at the Ar K Edge

Author(s)
Thomas W. LeBrun, S H. Southworth, G B. Armen, M A. MacDonald, Y Azuma
Partial cross sections for Ar K-LZL3(1 D2)np, n=4 and 5 spectator Auger states excited by x-ray absorption across the K-edge were measured and compared with...

Algorithms for Calculating Single-Atom Step Heights

Author(s)
Joseph Fu, V W. Tsai, R Koning, Ronald G. Dixson, Theodore V. Vorburger
Recently, measuring Si(111) single atomic steps prompted us to investigate the measuring technique. The section technique is the most popular method for...

Evaluation of Variance in Zeta Potential Measurements

Author(s)
M Chapman-Wilbert, S Delagah, J J. Pellegrino
We evaluated sources of varience in the measurement of the surface zeta potential of flat sheet specimens of cellulose di/triacetate membranes with a commercial...

Optical Monitoring of Polypropylene Injection Molding

Author(s)
C L. Thomas, Anthony J. Bur
We have constructed an optical fiber sensor for monitoring injection molding and we have developed a model to describe sensor behavior. The sensor consists of a...

Magneto-Optical Measurements of Co-Pt (111) Multilayers

Author(s)
R A. Fry, Lawrence H. Bennett, Edward Della Torre, Robert D. Shull, William F. Egelhoff Jr., R F. Farrow, C H. Lee
An automated magneto-optical Kerr effect (MOKE) magnetometer was used to measure the polar Kerr rotation and ellipticity loops of multilayers with X = 0.3 nm to...

A Comparison of Different Micromagnetic Solvers

Author(s)
L L. Diaz, J G. Eicke, Edward Della Torre
Micromagnetic equations have characteristics that differ from electromagnetic field problems. Under certain conditions, EM solvers are not very efficient. This...

Magnetic Reversal on Vicinal Surfaces

Author(s)
R Hyman, A Zangwill, Mark D. Stiles
We present a theoretical study of in-plane magnetization reversal for vicinal ultrathin films using a one-dimensional micromagnetic model with nearest-neighbor...

Exchange Bias Relaxation in CoO-Biased Films

Author(s)
Robert McMichael, C Lee, Mark D. Stiles, F Serpa, P J. Chen, William F. Egelhoff Jr.
Because the memory of the bias direction is carried by the antiferromagnetic order in exchange biased films, the stability of the antiferromagnetic order is...
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