NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Relaxation Times for Magnetization Reversal in a High Coercivity Magnetic Thin Film
Published
Author(s)
Thomas J. Silva, Anthony B. Kos, N D. Rizzo
Abstract
We used a magneto-optical Kerr effect microscope to measure 180° magnetization reversal in a high coercivity CoCr10Ta4 thin film subjected to nanosecond field pulses. Exponential magnetization decay occurs for pulse duration tp10 ns, indicating a crossover from nonequilibrium magnetization relaxation at short tp to metastable equilibrium and thermal relaxation for longer tp. We conclude that the nonequilibrium magnetization relaxation time (τn) and that the average relaxation time of microscopic thermal fluctuations (τ0) is τn = τ0≈5 ns.
Silva, T.
, Kos, A.
and Rizzo, N.
(1999),
Relaxation Times for Magnetization Reversal in a High Coercivity Magnetic Thin Film, Physical Review Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905315
(Accessed October 11, 2025)