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Journals

Electrical metrology with single electrons

Author(s)
Neil M. Zimmerman, Mark W. Keller
This paper is mostly a review of the progress made at NIST in pursuing a capacitance standard based on the charge of the electron. We briefly introduce the...

EMC Research at NIST, Boulder

Author(s)
Perry F. Wilson, Christopher L. Holloway, Galen H. Koepke, John M. Ladbury, Arthur Ondrejka, Robert T. Johnk, Keith D. Masterson, Dennis G. Camell
N/A

In-focal-plane SQUID multiplexer

Author(s)
Kent D. Irwin, Damian Audley, James A. Beall, Joern Beyer, Steven Deiker, W.Bertrand (Randy) Doriese, William Duncan, Gene C. Hilton, Wayne Holland, Joel Ullom, Leila R. Vale, Yizi Xu
Superconducting quantum interference device (SQUID) multiplexers make it possible to build arrays of thousands of low-temperature microcalorimeters and...

UML 2 Activity and Action Models

Author(s)
Conrad E. Bock
This is the first in a series introducing the activity model in the Unified Modeling Language, version 2 (UML 2), and how it integrates with the action model [1...

Resonant Soft X-Ray Photofragmentation of Propane

Author(s)
William E. Wallace, Daniel A. Fischer
A comparison was made between the mass spectra of propane (CH6d3^CH 2CH 3) for resonant soft X-ray photofragmentation and electron-impact ionization. The soft X...
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