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Journals

Response of a Silicon Photodiode to Pulsed Radiation

Author(s)
Robert E. Vest, Steven E. Grantham
Both the integrated-charge and peak-voltage responsivity of a 1 cm2 Si photodiode optimized for the extreme ultraviolet have been measured with 532 nm...

Phototransduction: Crystal Clear

Author(s)
K D. Ridge, N G. Abdulaev, M Sousa, K Palczewski
Advances in the structure determination of proteins involved in vertebrate phototransduction suggest that this will be the first G protein-coupled receptor...

Frequency dependence of capacitance standards

Author(s)
Yicheng Wang
We measured the frequency dependence of a 10 pF transportable fused-silica capacitor from 50 Hz to 20 kHz. The results have a relative standard uncertainty of 0...

Structural Signatures of Varification in Hard Core Fluids

Author(s)
S K. Kumar, Jack F. Douglas, Francis W. Starr, S Garde
We investigate the capacities of local measures of free volume in liquids to predict basic aspects of the fluids state- the formation of a liquid from a gas...

Simplified System for Creating a Bose-Einstein Condensate

Author(s)
H J. Lewandowski, D M. Harber, D Whitaker, Eric A. Cornell
We designed and constructed a simplified experimental system to create a Bose-Einstein condensate in 87Rb. Our system has several novel features including a...

Compact Solid-State Waveguide Lasers

Author(s)
Berton Callicoatt, John B. Schlager, Robert K. Hickernell, Richard Mirin, Norman Sanford
DBR and mode-locked Er/Yb waveguide lasers offer single-frequency and ultralow jitter performance.

Refractive Index Study of AlxGa1-xN Films Grown on Sapphire Substrates

Author(s)
Norman Sanford, Larry Robins, Albert Davydov, Alexander J. Shapiro, Denis V. Tsvetkov, Vladimir A. Dmitriev, Stacia Keller, Umesh Mishra, Steven P. DenBaars
A prism coupling method was used to measure the ordinary (italic}n o) and extraordinary (italic}n e) refractive indices of Al xGa 1-xN films, grown by hydride...

Machining Cracks Revealed by Fractography

Author(s)
George D. Quinn, L K. Ives, S Jahanmir
Fractography detected and characterized the nature and size of strength limiting rods and bars in a sintered reaction bonder silicon nitride that was ground by...
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