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Extinction Near-Field Optical Microscopy



H F. Hamann, M Larbadi, S Barzen, T Brown, Alan Gallagher, David Nesbitt


Two AFM-assisted, apertureless, optical-imaging methods are presented. These overcome the severe resolution consrtaints of aperture-based Near-field Scanning Optical Microscopy by probing the highly localized mutual near-field interaction between AFM-tip and sample. Specifically, we monitor the evanescent field scattering and the extinction of the reflected intensity while the tip is scanned over Au-nanoparticles. We describe a significant improvement in optically detected spatial resolution (approximately equal to} 2 nm to 3 nm) and introduce a new, more quantitative method for optical imaging.
Optics Communications
No. 1-3


AFM, extinction, nanoparticles, NSOM, resolution, scattering


Hamann, H. , Larbadi, M. , Barzen, S. , Brown, T. , Gallagher, A. and Nesbitt, D. (2003), Extinction Near-Field Optical Microscopy, Optics Communications (Accessed July 17, 2024)


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Created October 31, 2003, Updated October 12, 2021