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Journals

The Influence of Defects on the Morphology of Si (111) Etched in NHF

January 1, 2005

Author(s)

Hui Zhou, Joseph Fu, Richard M. Silver

We have implemented a kinetic Monte-Carlo (KMC) simulation to study the morphologies of Si (111) surfaces etched in NHF. Although our initial simulations...

Traceable Calibration of Critical-Dimension Atomic Force Microscope Linewidth Measurements with Nanometer Uncertainty

January 1, 2005

Author(s)

Ronald G. Dixson, Richard A. Allen, William F. Guthrie, Michael W. Cresswell

The use of critical dimension atomic force microscopes (CD-AFMs) in semiconductor manufacturing, both for process control and as a reference metrology tool, is...

Line Edge Roughness Metrology Using Atomic Force Microscopes

January 1, 2005

Author(s)

Ndubuisi G. Orji, Theodore V. Vorburger, Joseph Fu, Ronald G. Dixson, C Nguyen, Jayaraman Raja

Line edge roughness measurements using two types of atomic force microscopes and two types of tips are compared. Measurements were made on specially prepared...

Scanning Electron Microscope Dimensional Metrology using a Model-based Library

January 1, 2005

Author(s)

John S. Villarrubia, Andras Vladar, Michael T. Postek

The semiconductor electronics industry places significant demands upon secondary electron imaging to obtain dimensional measurements that are used for process...

Variable Pressure/Environmental SEM a Powerful Tool for Nanotechnology and Nanomanufacturing

January 1, 2005

Author(s)

Michael T. Postek, Andras Vladar

Instrumentation and metrology are integral to the emerging nanotechnology enterprise, and have been identified by the U. S. National Nanotechnology Initiative...

Representation of Acoustic Waves in Unbounded Domains

January 1, 2005

Author(s)

Bradley K. Alpert, Y Chen

Compact, time-harmonic, acoustic sources produce waves that decay too slowly to be square-integrable on a line away from the sources. We introduce an inner...

2D and 3D Surface Texture Comparisons Using Autocorrelation Functions

January 1, 2005

Author(s)

Jun-Feng Song, Li Ma, Eric P. Whitenton, Theodore V. Vorburger

Autocorrelation and cross-correlation functions are proposed for 2D and 3D surface texture comparisons. At the maximum correlation point of the two correlated...

Efficient generation of correlated photon pairs in a microstructure fiber

January 1, 2005

Author(s)

Jingyun Fan, Alan L. Migdall, L J. Wang

Generation of cross-polarized photon pairs in a microstructure fiber with frequency-conjugate laser pump pulses

January 1, 2005

Author(s)

Jingyun Fan, Alan L. Migdall

Efficient generation of correlated photon pairs in a microstructure fiber

January 1, 2005

Author(s)

Jingyun Fan, Alan L. Migdall, L J. Wang

Measurement of the Neutron Lifetime by Counting Trapped Protons in a Cold Neutron Beam

January 1, 2005

Author(s)

Jeffrey S. Nico, Maynard S. Dewey, David M. Gilliam, Fred E. Wietfeldt, X Fei, W M. Snow, G L. Greene, J Pawels, R Eykens, A Lamberty, J S. Van gestel

Two-photon mode preparation and matching efficiency: definition, measurement and optimization, CPEM04

January 1, 2005

Author(s)

Stefania Castelletto, Ivo P. Degiovanni, G Furno, Alan L. Migdall, V Schettini, M J. Ware

Spatial and spectral mode selection of heralded single photons from Parametric Down-Conversion in bulk and PPLN, ed. by R.E. Myers and Y. Shih

January 1, 2005

Author(s)

Stefania Castelletto, Ivo P. Degiovanni, Alan L. Migdall, V Schettini

High-Throughput Modulus Measurements of Ultra-Soft Polymer Networks

January 1, 2005

Author(s)

Elizabeth A. Wilder, Shu Guo, Martin Chiang, Christopher Stafford

A metrology for rapidly measuring the modulus of ultra-soft polymer networks has been developed. The method utilizes compression-induced buckling of a sensor...

Combinatorial and High-Throughput Measurements of the Modulus of Thin Polymer Films

January 1, 2005

Author(s)

Christopher Stafford, Shu Guo, Martin Chiang, C Harrison

An Informatics Infrastructure for Combinatorial and High-throughput Materials Research Built on Open Source Code

January 1, 2005

Author(s)

Weiping Zhang, Michael J. Fasolka, Alamgir Karim, Eric J. Amis

Laboratory Research Informatics Systems (LRIS) hold great promise in streamlining research generally, and are particularly necessary for new data-intensive...

Combinatorial Approach to the Edge Delamination Test for Thin Film Reliability --- Adaptability and Variability

January 1, 2005

Author(s)

Martin Chiang, R Song, A J. Crosby, Alamgir Karim, C. K. Chiang, Eric J. Amis

Combinatorial Approaches for Characterizing Thin Film Bond Strength

January 1, 2005

Author(s)

Martin Chiang, D Kawaguchi, Christopher Stafford

A combinatorial approach to the edge delamination test was carried out to obtain the failure map of the epoxy/glass bond joint as a function of both temperature...

Bioactive Surface Gradients to Control Cell Adhesion

January 1, 2005

Author(s)

Matthew Becker, Nathan D. Gallant, Eric J. Amis

Incorporating discrete cell adhesion motifs onto substrates in a defined orientation with variable spacing and increasing concentration offers a robust strategy...

Examination of the Covalent Cationization Method Using Narrow Polydisperse Polystyrene

January 1, 2005

Author(s)

H M. Byrd, S Bencherif, Barry J. Bauer, Kathryn Beers, Y Brun, Sheng Lin-Gibson, N Sari

Cellular Response to Phase-Separated Blends of Tyrosine-Derived Polycarbonates

January 1, 2005

Author(s)

Matthew Becker, L A. Bailey, J S. Stephens, Aarti Rege, J Kohn, Eric J. Amis

New Magnetic Phases of bcc-Co Thin Films

January 1, 2005

Author(s)

T Monchesky, John Unguris

We have been able to observe two new magnetic phases of ultrathin Co by growing atomically well ordered Co films on cleaved GaAs(110) substrates. For a Co...