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Combinatorial Approach to the Edge Delamination Test for Thin Film Reliability --- Adaptability and Variability

Published

Author(s)

Martin Chiang, R Song, A J. Crosby, Alamgir Karim, C. K. Chiang, Eric J. Amis
Citation
Thin Solid Films
Volume
476

Keywords

Adhesives, Combinatorial and THE Methods, Mechancial Properties, Thin Films, adhesion, combinatorial approach, edge delamination, fracture toughness, surface energy, thin film

Citation

Chiang, M. , Song, R. , Crosby, A. , Karim, A. , Chiang, C. and Amis, E. (2005), Combinatorial Approach to the Edge Delamination Test for Thin Film Reliability --- Adaptability and Variability, Thin Solid Films, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853965 (Accessed June 12, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2004, Updated October 12, 2021