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Journals

CAD/CAPP Integration using Feature Ontology

Author(s)
C Dartigues, P Ghodous, Michael Gruninger, D Pallez, Ram D. Sriram
In a collaborative computer-supported engineering environment, the interoperation of various applications will need a representation that goes beyond the...

Enhanced Quantum State Detection Efficiency Through Quantum Information Processing

Author(s)
T Schaetz, Murray D. Barrett, Dietrich G. Leibfried, Joseph W. Britton, J Chiaverini, Wayne M. Itano, John D. Jost, E Knill, Christopher Langer, David J. Wineland
We investigate theoretically and experimentally how quantum state-detection efficiency is improved by the use of quantum information processing (QIP)...

Fusion of Biometric Algorithms in Recognition Problem

Author(s)
Andrew L. Rukhin, Igor Malioutov
This note concerns the mathematical aspects for several biometric algorithms in the recognition or identification problem. It is assumed that a biometric...

Scattering-Parameter Models and Representations for Microwave Mixers

Author(s)
Dylan F. Williams, Fabien Ndagijimana, Catherine A. Remley, Joel Dunsmore, Sean Hubert
We present straight-forward models and representations for RF and image mixers, and develop simple rules for transforming electrical problems involving mixers...

Multi-Sample Couette Viscometer for Polymer Formulations

Author(s)
H J. Walls, Robert F. Berg, Eric J. Amis
We describe a prototype scalable viscometer aimed at facilitating rapid measurements of multiple samples. The device simultaneously measures the viscosity of...

Standards Requirements for LADARs?

Author(s)
Geraldine S. Cheok, William C. Stone, Alan M. Lytle
This paper presents a discussion of standards requirements for LADAR. Two specific questions are addressed: (1) is there a need for such standards and (2) what...

Underinvestment in Public Good Technologies

Author(s)
Gregory C. Tassey
R&D policy has not adequately modeled the relevant R&D underinvestment phenomena and thus is unable to characterize, explain, and measure such underinvestment...

IPC-Split Cylinder Standard

Author(s)
James R. Baker-Jarvis
This method is intended for the nondestructive measurement of the relative permittivity and loss tangent of unclad dielectric substrates at microwave...
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