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Journals

Integral Operators and Delay Differential Equations

Author(s)
David E. Gilsinn, Florian A. Potra
We begin this expository essay by reviewing with examples what a typical engineer already knows about statistics. We then consider a central question in...

Nanoparticle Lithography and Imaging Scanning Probe Microscopy

Author(s)
Jaroslaw Grobelny, De-Hao D. Tsai, Doo-In Kim, Pradeep N. Namboodiri, Robert F. Cook, Michael R. Zachariah
Scanning tunnelling microscopy (STM) imaging was performed on goldsurfaces with a large coverage of monodispersed silver nanoparticlessoft-landed on the surface...

Mutation-Biased Adaptation in a Protein NK Model

Author(s)
Arlin B. Stoltzfus
Evolutionary trends responsible for systematic differences in genome and proteome composition have been attributed to GC:AT mutation bias in the context of...

The Interface Development for Machine Shop Simulation

Author(s)
Yan Luo, Yung-Tsun T. Lee
Modeling and simulation technology is recognized for facilitating training, reducing production cost, improving product quality, and shortening development time...

Eliminating FFT Artifacts in Vector Signal Analyzer Spectra

Author(s)
Michael McKinley, Kate Remley, M. Myslinski, J. S. Kenney
We present a method to minimize spectral leakage in measurements of periodic signals made with the vector signal analyzer (VSA) by taking into account the...

Microcantilever Torque Magnetometry Study of Patterned Magnetic Films

Author(s)
L. Yuan, Lan Gao, R. Sabirianov, Sy-hwang Liou, Michelle Chabot, Dong-Hoon Min, John M. Moreland, Bao Shan Han
Microcantilever torque magnetometry (MTM) is a sensitive tool to measure small magnetization changes in the sample. In this paper, we investigated a process for...

Phase Velocity in Resonant Structures

Author(s)
James R. Baker-Jarvis, Michael D. Janezic, Derik Love, Thomas Mitchell (Mitch) Wallis, Christopher L. Holloway, Pavel Kabos
In this paper we present a simple experimental procedure for studying the phase velocity behavior of a metafilm with tunable material properties. Using this...
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