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Journals

Demonstrating the Comparability of Certified Reference Materials

Author(s)
David L. Duewer, Katrice A. Lippa, Stephen E. Long, Karen E. Murphy, Katherine E. Sharpless, Lorna T. Sniegoski, Michael J. Welch
Certified Reference Materials (CRMs) enable the meaningful comparison of measurement results over time and place. When CRMs are used to calibrate or verify the

Two-Body Models for Analyzing Complex Impedance

Author(s)
Douglas A. Bennett, Robert D. Horansky, Joel N. Ullom
Complex impedance is an important and widely used technique for characterizing microbolometers and microcalorimeters. Often, complex impedance data from actual

Optimize Noise Filtration through Dynamical Decoupling

Author(s)
Hermann Uys, Michael J. Biercuk, John J. Bollinger
One approach to maintaining phase coherence of qubits through dynamical decoupling consists of applying a sequence of Hahn spin-echo pulses. Recent studies have

A Guide to the RIA Workshop Data Archive

Author(s)
Ian M. Soboroff
During the course of the Reliable Information Access (RIA) workshop, a data archive was created to hold the outputs of the many experiments being done. This

The Virtual Cybernetic Building Testbed-A Building Emulator

Author(s)
Steven T. Bushby, Michael A. Galler, Natascha S. Milesi-Ferretti, Cheol D. Park
Building emulators couple computer simulations to real control hardware, creating a useful tool for studying building control system performance. The National

Approaches to color rendering measurement

Author(s)
Wendy L. Davis, Yoshihiro Ohno
Color rendering refers to a light source’s ability to make the colors of illuminated objects appear natural or accurate. The Color Rendering Index (CRI) is

At-Wavelength Metrology for EUV Lithography at NIST

Author(s)
Charles S. Tarrio, Steven E. Grantham, Robert E. Vest, Thomas B. Lucatorto
The National Institute of Standards and Technology (NIST) is active in many areas of metrology impacting extreme ultraviolet lithography. We will describe our

Frustrated magnetization reversal in Co/Pt multilayer films

Author(s)
Joseph E. Davies, O Hellwig, Eric E. Fullerton, M. Winklhofer, Robert D. Shull, Kai Liu
The magnetization reversal behavior in Co/Pt multilayers with perpendicular anisotropy are studied by the first order reversal curve (FORC) method. In addition

Purity determination as needed for the realisation of primary standards for elemental determination - status of international comparability

Author(s)
Gregory C. Turk, Heinrich Kipphardt, Ralf Matschat, Jochen Vogl, Tamara Gusarova, Michael Czerwensky, Hans-Joachim Heinrich, Akiharu Hioki, Leonid A. Konopelko, Brad Methven, Tsutomu Miura, Ole Petersen, Gundel Riebe, Ralph Sturgeon, Lee L. Yu
Within the National Metrology Institutes (NMIs) and designated laboratories, an interlaboratory comparison, CCQM-P107, was conducted to verify the degree of
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