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Journals

Investigation of LS-Coupling in Boron-Like Ions

January 1, 1994

Author(s)

S Glenzer, H -. Kunze, J Musielok, Y -. Kim, Wolfgang L. Wiese

Spectrum and energy levels of five-times ionized niobium (NbVI)

January 1, 1994

Author(s)

J O. Ekberg, Joseph Reader

On the Accuracy of Molecular Data in the Understanding of Ultracold Collisions

January 1, 1994

Author(s)

O Dulieu, J Weiner, Paul S. Julienne

Fragment Angular Distributions in One and Two-Color Photodissociation by Strong Laser Fields

January 1, 1994

Author(s)

E Charron, A Giusti-suzor, F H. Mies

Loss from Magneto-optical Traps in Strong Laser Fields

January 1, 1994

Author(s)

Y B. Band, I Tuvi, K -. Suominen, K Burnett, Paul S. Julienne

Long-range Molecular States and Ultracold Photoassociative Ionization Collisions

January 1, 1994

Author(s)

V S. Bagnato, J Weiner, Paul S. Julienne, Carl J. Williams

Structure and Performance of Si/Mo Multilayer Mirrors for the Extreme Ultra-violet,

January 1, 1994

Author(s)

J M. Slaughter, D W. Schulze, C R. Hillis, A Mirone, R Stalio, R N. Watts, Charles Tarrio, Thomas B. Lucatorto, Michael Krumrey, P Mueller, C M. Falco

Si/B^d4C Narrow-Bandpass Mirrors for the Extreme Ultraviolet,

January 1, 1994

Author(s)

J M. Slaughter, B S. Meadower, R N. Watts, Charles Tarrio, Thomas B. Lucatorto, C M. Falco

The National Institute of Standards and Technology Very High Resolution Spectrometer, in Proceedings of the 8th Natl. Conf. on Synchrotron Radiation Research,

January 1, 1994

Author(s)

H D. Morgan, J D. Fortna, H M. Seyoum, Mitchell L. Furst, L R. Hughey, D C. Humm, A Asfaw

Photon-Excited Soft-X-Ray Emission from LiBr and LiCl: Phonon Relaxation for Li K Excitations,

January 1, 1994

Author(s)

K E. Miyano, D L. Ederer, T A. Callcott, Q -. Dong, J J. Jia, Lubo Zhou, D R. Mueller

Study of Ca Autoionisation Levels Using Multiphoton Techniques,

January 1, 1994

Author(s)

N M. Laham, J -. Kim, X Xiong, T J. McIlrath, Thomas B. Lucatorto, N Y. Ayoub

The Identification of the Ca 3d4f Autoionizing Levels by the Application of Multiphoton Polarization Selection Rules,

January 1, 1994

Author(s)

J B. Kim, X Xiong, N M. Laham, Thomas B. Lucatorto, T J. McIlrath

The Very High Resolution Spectrometer at the National Institute of Standards and Technology

January 1, 1994

Author(s)

J Fortna, H Morgan, H M. Seyoum, A Asfaw, Mitchell L. Furst, L R. Hughey

Comparative Strategies for Correction of Interferences in Isotope Dilution Mass Spectrometric Determination of Vanadium,

January 1, 1994

Author(s)

J D. Fassett, E S. Beary, X Xiong, L J. Moore

Atomic Negative-Ion Resonances,

January 1, 1994

Author(s)

S J. Buckman, Charles W. Clark

Soft X-Ray Damage to p-terphenyl Coatings for Detectors

January 1, 1994

Author(s)

E L. Benitez, M L. Dark, D E. Husk, S E. Schnatterly, Charles Tarrio

Systems Integration Needs of U.S. Manufacturers

January 1, 1994

Author(s)

Selden Stewart, G Pinholster

In August 1994, the National Institute of Standards and Technology (NIST) held a workshop for industry leaders to address the question of the need for systems

Integrating DFM with CAD through Design Critiquing

January 1, 1994

Author(s)

Satyandra K. Gupta, William Regli, D Nau

The increasing focus on design for manufacturability (DFM) in research in concurrent engineering design is expanding the scope of traditional design activities

Strategy for Post-Process Control of a Machine Tool

January 1, 1994

Author(s)

Theodore V. Vorburger, K Yee, Brian R. Scace, F Rudder

The automated control of machine-tool accuracy is discussed based on a quality architecture containing three control loops: real-time, process-intermittent, and

Methods Divergence Between Measurements of Micrometer and Sub-Micrometer Surface Features

January 1, 1994

Author(s)

T Mcwaid, Theodore V. Vorburger, Joseph Fu, Jun-Feng Song, Eric P. Whitenton

Measurements of micrometer and sub-micrometer surface features have been made using a stylus profiler, an STM, an AFM, and a phase-measuring interferometric

Electron Beam Interaction Modeling as Applied to X-Ray Lithography Mask SEM Linewidth Metrology

January 1, 1994

Author(s)

Michael T. Postek, J R. Lowney, Andras Vladar, William J. Keery, Egon Marx, Robert D. Larrabee

This work provides an approach to improved x?ray mask linewidth metrology and a more precise edge location algorithm for measurement of feature sizes on x?ray

A Novel CMM Interim Testing Artifact

January 1, 1994

Author(s)

Steven D. Phillips, Bruce R. Borchardt, Gregory W. Caskey, David E. Ward, Bryon S. Faust, Daniel S. Sawyer

NIST is currently developing equipment and techniques to rapidly access the performance of Coordinate Measuring machines (CMMs). This will allow the frequent

Ultrashallow Depth Profiling with Time-of-flight Secondary Ion Mass Spectrometry

January 1, 1994

Author(s)

J. Bennett, John A. Dagata

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is an efficient, sensitive method for characterizing semiconductor surfaces. In addition, TOF-SIMS can

Fiber Splice Loss: A Simple Method of Calculation

January 1, 1994

Author(s)

R. L. Gallawa, A. R. Kumar, Andreas Weisshaar

Error Propagation in Laser Beam Spatial Parameters

January 1, 1994

Author(s)

Richard D. Jones, Thomas Scott

Heat Flux From Flames to Vertical Surfaces

January 1, 1994

Author(s)

J. G. Quintiere, Thomas Cleary

Dimensional analysis is used to examine heat transfer from flames to vertical surfaces. Configurations include a line fire against a wall, a square burner flame

Comparison of a Fractal Smoke Optics Model With Light Extinction Measurements

January 1, 1994

Author(s)

R A. Dobbins, George W. Mulholland, Nelson P. Bryner

Optical cross-sections of carbonaceous aggregates (smoke) formed by combustion sources have been computed based on fractal concepts. Specific extinction depends

Glide Matching With Binary and Ternary Zeotropic Refrigerant Mixtures. Part 1. An Experimental Study

January 1, 1994

Author(s)

W. J. Mulroy, Piotr A. Domanski, David Didion

An improvement of the coefficient of performance (COP) of the refrigeration cycle can be realized when temperature profiles of the refrigerant mixture and the

Simultaneous Optical Measurement of Soot Volume Fraction and Temperature in Premixed Flames

January 1, 1994

Author(s)

M Y. Choi, Anthony Hamins, George W. Mulholland, Takashi Kashiwagi

The performance of a three-wavelength optical probe technique for measuring soot volume fraction and temperature was assessed by conducting experiments in the

Surface Degradation of Superconducting YBa₂Cu₃O_7-δ Thin Films

January 1, 1994

Author(s)

Stephen E. Russek, S. Sanders, Alexana Roshko, John (Jack) W. Ekin

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