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Conferences

Using Semantic Web Technologies to Integrate Models to Analytical Tools

November 9, 2015

Author(s)

Peter O. Denno, Mark R. Blackburn

This paper discusses the potential advantages and pitfalls of using semantic web technologies in the process of preparing engineering analyses. Analytical tools

Preliminary Safety Performance Assessment on NIST's LEU Fueled Beam Reactor

November 8, 2015

Author(s)

Zeyun NMN Wu, Robert E. Williams, J. Michael Rowe

Reactor Power Distribution Calculation in Research Reactors Using MCNP

November 8, 2015

Author(s)

Zeyun NMN Wu, Robert E. Williams

MEASUREMENT OF DNA REPAIR PROTEINS IN RELATION TO DISEASE BIOMARKERS AND DRUG DEVELOPMENT

November 7, 2015

Author(s)

Erdem Coskun, Pawel Jaruga, Leona D. Scanlan, Alessandro Tona, Mark S. Lowenthal, Prasad T. Reddy, M Miral Dizdar, Ann-Sofie Jemth, Olga Loseva, Thomas Helleday

Introduction: In aerobic organisms, intracellular metabolism and exogenous sources such as ionizing radiation and carcinogenic compounds generate reactive

Biosimulant Artifact with Embedded Calcium Alginate Bead Sensor for Robot Impact Safety Testing

November 5, 2015

Author(s)

Hongliang Shi, Nicholas G. Dagalakis

This paper presents the design of a disposable biosimulant human tissue artifact system for robot safety testing. It is used to show a clear sign of the severe

Performance evaluation of a laser tracker hand held touch probe

November 4, 2015

Author(s)

Bala Muralikrishnan, Christopher J. Blackburn, Prem K. Rachakonda, Daniel S. Sawyer

Hand-held touch probes and laser scanners are increasing the scope and applicability of laser trackers. While methods to evaluate the performance of laser

Photomask Linewidth Comparison by PTB and NIST

November 2, 2015

Author(s)

Detleff Bergmann, Bernd Bodermann, Harald Bosse, Egbert Buhr, Gaoliang Dai, Ronald G. Dixson, W H?er-Grohne

We report the initial results of a recent bilateral comparison of linewidth or critical dimension (CD) calibrations on photo-mask line features between two

Using Semantic Web Technologies for Integrating Domain Specific Modeling and Analytical Tools

November 1, 2015

Author(s)

Peter O. Denno, Mark R. Blackburn

This paper discusses the potential advantages and pitfalls of using semantic web technologies for representing and integrating modeling and analysis tools

Evaluation of the Range Performance of Laser Scanners Using Non-planar Targets.

November 1, 2015

Author(s)

Prem K. Rachakonda, Balasubramanian Muralikrishnan, Craig M. Shakarji, Vincent D. Lee, Daniel S. Sawyer

The Dimensional Metrology Group (DMG) at the National Institute of Standards and Technology (NIST) is supporting the development of documentary standards for

Analysis and Optimization in Smart Manufacturing based on a Reusable Knowledge Base for Process Performance Models

November 1, 2015

Author(s)

Alexander Brodsky, Guodong Shao, Mohan Krishnamoorthy, Anantha Narayanan Narayanan, Daniel Menasce?, Ronay Ak

In this paper, we propose an architectural design and software framework for fast development of descriptive, predictive, diagnostic, and prescriptive analytics

DNA Extraction and DNA Damage Measurement in the Nematode Caenorhabditis elegans

November 1, 2015

Author(s)

Leona D. Scanlan, Pawel Jaruga, Sanem Hosbas Coskun, Jamie L. Almeida, David N. Catoe, Jennifer McDaniel, Miral M. Dizdar

Little is known about endogenous DNA damage in the nematode. In this work, we standardized the growth of the nematode in two different growth media (axenic CeHR

Design and calibration of an artifact for evaluating laser scanning articulating arm CMMs used for measuring complex non-concurrent surfaces

October 30, 2015

Author(s)

Vincent D. Lee, Steven D. Phillips, Craig M. Shakarji, Jeffrey Hosto, Jeffrey Huber, Gillich Barbara

Dimensional metrology is a foundational science finding applications throughout modern technology, including the testing of human-worn body armor designed to

Considerations and Recommendations for Data Availability for Data Analytics for Manufacturing

October 29, 2015

Author(s)

Donald E. Libes, Seungjun Shin, Jungyub Woo

Data analytics is increasingly becoming recognized as a valuable set of tools and techniques for improving performance in the manufacturing enterprise. However

Inferring the Stealthy Bridges between Enterprise Network Islands in Cloud Using Cross-Layer Bayesian Networks

October 29, 2015

Author(s)

Anoop Singhal, Xiaoyan Sun, Jun Dai, Peng Liu

Enterprise networks are migrating to the public cloud to acquire computing resources for a number of promising benefits in terms of efficiency, expense, and

A Neural Network Meta-Model and its Application for Manufacturing

October 29, 2015

Author(s)

David J. Lechevalier, Ronay Ak, Steven Hudak, Yung-Tsun T. Lee, Sebti Foufou

Manufacturing generates a vast amount of data both from operations and simulation. Extracting appropriate information from this data can provide insights to

The NIST IAD Data Science Evaluation Series: Part of the NIST Information Access Division Data Science Research Program

October 29, 2015

Author(s)

Bonnie J. Dorr, Craig Greenberg, Peter Fontana, Mark A. Przybocki, Marion Le Bras, Cathryn A. Ploehn, Oleg Aulov, Wo L. Chang

The Information Access Division (IAD) of the National Institute of Standards and Technology (NIST) launched a new Data Science Research Program (DSRP) in the

Automated uncertainty quantification analysis using system model and data

October 29, 2015

Author(s)

Saideep Nannapaneni, Sankaran Mahadevan, David Lechevalier, Anantha Narayanan Narayanan, Sudarsan Rachuri

Understanding the sources of, and quantifying the magnitude of, uncertainty can improve decision-making and, thereby, make manufacturing systems more efficient

A "Smart Component" Data Model in PLM

October 28, 2015

Author(s)

Yunpeng Li, Utpal Roy, Seungjun Shin, Yung-Tsun Lee

Today's physical products are becoming smarter not only because of their increasingly complex functionalities, but also for their superior capabilities of

SIMULTANEOUS DIELECTROPHORETIC TRAPPING OF CELL ON OPPOSITE SIDES OF A PERMEABLE MEMBRANE

October 25, 2015

Author(s)

Brian J. Nablo, Darwin Reyes-Hernandez

Molecular transport through permeable membranes offers a unique opportunity to investigate cellular responses to nutrients, drugs, or toxins delivered to the

Linear Temporal Logic (LTL) Based Monitoring of Smart Manufacturing Systems

October 23, 2015

Author(s)

Gerald Heddy, Umer Huzaifa, Peter A. Beling, Yacov Haimes, Jeremy Marvel, Brian A. Weiss, Amy LaViers

The vision of Smart Manufacturing Systems (SMS) includes collaborative robots that can adapt to a range of scenarios. This vision requires a classification of

System Interdependency Modeling in the Design of Prognostic and Health Management Systems in Smart Manufacturing

October 23, 2015

Author(s)

M Malinowski, Peter A. Beling, Amy LaViers, Jeremy Marvel, Brian A. Weiss

The development of risk analysis, and prognostics and health management (PHM) have developed in a largely independent fashion. However, both fields share a

A Sensor-Based Method for Diagnostics of Machine Tool Linear Axes

October 23, 2015

Author(s)

Gregory W. Vogl, Brian A. Weiss, Alkan Donmez

A linear axis is a vital subsystem of machine tools, which are vital systems within many manufacturing operations. When installed and operating within a

Adaptive Multi-scale PHM for Robotic Assembly Processes

October 23, 2015

Author(s)

Benjamin Y. Choo, Peter A. Beling, Amy LaViers, Jeremy Marvel, Brian A. Weiss

Adaptive multi-scale prognostics and health management (AM-PHM) is a methodology designed to support PHM in smart manufacturing systems. AM-PHM is characterized

Measurement Science for Prognostics and Health Management for Smart Manufacturing Systems: Key Findings from a Roadmapping Workshop

October 23, 2015

Author(s)

Brian A. Weiss, Gregory W. Vogl, Moneer Helu, Guixiu Qiao, Joan Pellegrino, Mauricio Justiniano, Anand Raghunathan

The National Institute of Standards and Technology (NIST) hosted the Roadmapping Workshop - Measurement Science for Prognostics and Health Management for Smart

Development of Standard Test Methods for Evaluation of ROV/AUV Performance for Emergency Response Applications

October 21, 2015

Author(s)

Adam S. Jacoff, Kamel Saidi, Robert Von Loewenfeldt, Yukio Koibuchi

The present paper discusses the NIST and DHS efforts to develop standard test methods for aquatic response robots. Different ROVs and AUVs were used to evaluate

Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip Limit

October 21, 2015

Author(s)

Ronald G. Dixson, Ryan Goldband, Ndubuisi G. Orji

Critical dimension atomic force microscopes (CD-AFMs) use flared tips and two-dimensional sensing and control of the tip-sample interaction to enable scanning

The NIST IAD Data Science Research Program

October 19, 2015

Author(s)

Bonnie J. Dorr, Peter C. Fontana, Craig S. Greenberg, Mark A. Przybocki, Marion Le Bras, Cathryn A. Ploehn, Oleg Aulov, Martial Michel, Edmond J. Golden III, Wo L. Chang

We examine foundational issues in data science including current challenges, basic research questions, and expected advances, as the basis for a new Data

A virtual milling machine model to generate machine-monitoring data for predictive analytics

October 18, 2015

Author(s)

David Lechevalier, Seungjun Shin, Jungyub Woo, Sudarsan Rachuri, Sebti Foufou

Real data from manufacturing processes are essential to create useful insights for decision-making. However, acquiring real manufacturing data can be expensive

Optical-to-RF Frequency Synthesis: Application Priorities for Ultra-low Phase Noise

October 18, 2015

Author(s)

David A. Howe, Archita Hati, Craig W. Nelson, Lora L. Nugent-Glandorf

We describe operational challenges and progress of optical frequency-comb dividers (OFDs) that synthesize RF signals from the optical domain. Our priorities

NIST on a Chip: Realizing SI units with microfabricated alkali vapour cells

October 16, 2015

Author(s)

John E. Kitching, Elizabeth A. Donley, Svenja A. Knappe, Matthew T. Hummon, Argyrios Dellis, Jeffrey A. Sherman, Kartik A. Srinivasan, Vladimir A. Aksyuk, Qiliang Li, Daron A. Westly, Brian J. Roxworthy, Amit Lal

We describe several ways in which microfabricated alkali atom vapour cells might potentially be used to accurately realize a variety of SI units, including the

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