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Probing Nanoscale Objects in Liquids through Membranes with Near-Field Microwave Microscopy

Published

Author(s)

Alexander Tselev, Andrei Kolmakov

Abstract

In this work, scanning near-field microwave imaging was implemented to test the feasibility of the approach for in situ studies of nanosclale objects immersed in liquids under thin dielectric membranes. It was found that mechanical strength and stability of SiN membranes on Si frames are sufficient for contact mode imaging in a standard AFM setup. Model polystyrene particles immersed in glycerol in contact with the membrane from the cavity side could be reliably detected. The probing depth of this imaging mode can be estimated to be of about 100 nm.
Conference Dates
September 6-11, 2015
Conference Location
Paris, FR
Conference Title
Proceedings of the 2015 European Microwave Conference (EuMC)

Keywords

microwave imaging, scanning probe microscopy, impedance measurement, atomic force microscopy

Citation

Tselev, A. and Kolmakov, A. (2015), Probing Nanoscale Objects in Liquids through Membranes with Near-Field Microwave Microscopy, Proceedings of the 2015 European Microwave Conference (EuMC), Paris, FR, [online], https://doi.org/10.1109/EuMC.2015.7345850, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=918174 (Accessed February 27, 2024)
Created December 2, 2015, Updated April 6, 2022