Tselev, A.
and Kolmakov, A.
(2015),
Probing Nanoscale Objects in Liquids through Membranes with Near-Field Microwave Microscopy, Proceedings of the 2015 European Microwave Conference (EuMC), Paris, FR, [online], https://doi.org/10.1109/EuMC.2015.7345850, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=918174
(Accessed December 12, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Probing Nanoscale Objects in Liquids through Membranes with Near-Field Microwave Microscopy
Published
Author(s)
Alexander Tselev,
Abstract
In this work, scanning near-field microwave imaging was implemented to test the feasibility of the approach for in situ studies of nanosclale objects immersed in liquids under thin dielectric membranes. It was found that mechanical strength and stability of SiN membranes on Si frames are sufficient for contact mode imaging in a standard AFM setup. Model polystyrene particles immersed in glycerol in contact with the membrane from the cavity side could be reliably detected. The probing depth of this imaging mode can be estimated to be of about 100 nm.Conference Dates
September 6-11, 2015
Conference Location
Paris, FR
Conference Title
Proceedings of the 2015 European Microwave Conference (EuMC)
Pub Type
Conferences
Download Paper
Keywords
microwave imaging, scanning probe microscopy, impedance measurement, atomic force microscopy
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 2, 2015, Updated April 6, 2022