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Conferences

Ray-based classification framework for high-dimensional data

Author(s)
Justyna Zwolak, Jacob Taylor, Sandesh Kalantre, Thomas McJunkin, Brian Weber
While classification of arbitrary structures in high dimensions may require complete quantitative information, for simple geometrical structures, low

DARPA Organic Interconnect Characterization

Author(s)
Dylan Williams, Richard Chamberlin, Jerome Cheron, Sam Chitwood, Ken Willis, Brad Butler, Farhang Yazdani
We report on a study of interconnects fabricated on organic and silicon interposers used to connect state-of-the art digital, analog and RF chiplets

Key Considerations for Microbial Viability Measurements

Author(s)
Joy Dunkers, Sandra M. Da Silva, Stephanie Servetas, James J. Filliben, Guilherme L. Pinheiro, Nancy Lin
Making reliable measurements of antimicrobial killing efficacy requires careful consideration of the sources of biological variability, measurement bias and

A Science Gateway for Atomic and Molecular Physics

Author(s)
Barry I. Schneider, Klaus Bartschat, Oleg Zatsarinny, Igor Bray, Fernando Martin, Armin Scrinzi, Sudhakar Pamidighantam, Jonathan Tennyson, Jimena Gorfinkiel, Markus Klinker
We describe the creation of a new Atomic and Molecular Physics science gateway (AMPGateway). The gateway is designed to bring together a subset of the AMP

Enhancing LAA Co-existence Using MIMO Under Imperfect Sensing

Author(s)
Somayeh Mosleh, Yao Ma, Jason B. Coder, Erik Perrins, Lingjia Liu
To meet the ever growing wireless network demands, in terms of subscribers and data throughput, operating long term evolution (LTE) in unlicensed bands, also

DIGITAL TWIN FOR SMART MANUFACTURING: THE SIMULATION ASPECT

Author(s)
Guodong Shao, Sanjay Jain, Christoph Laroque, Loo Hay Lee, Peter Lendermann, Oliver Rose
The purpose of this panel is to discuss the state of the art in digital twin for manufacturing research and practice from the perspective of the simulation

Infrastructure for Model Based Analytics for Manufacturing

Author(s)
Sanjay Jain, Anantha Narayanan Narayanan, Yung-Tsun Lee
Multi-resolution simulation models of manufacturing system, such as the virtual factory, coupled with analytics offer exciting opportunities to manufacturers to
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