Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

On-Wafer Metrology of a Transmission Line Integrated Terahertz Source

Published

Author(s)

Kassiopeia A. Smith, Bryan T. Bosworth, Nicholas R. Jungwirth, Jerome G. Cheron, Nathan D. Orloff, Christian J. Long, Dylan F. Williams, Richard A. Chamberlin, Franklyn J. Quinlan, Tara M. Fortier, Ari D. Feldman

Abstract

A combination of on-wafer metrology and high-frequency network analysis was implemented to measure the response of transmission-line integrated Er-GaAs and InGaAs photomixers up to 1 THz to support the telecommunication and electronics industry.
Conference Dates
May 10-15, 2020
Conference Location
San Jose, CA
Conference Title
CLEO: Laser Science to Photonic Applications

Citation

Smith, K. , Bosworth, B. , Jungwirth, N. , Cheron, J. , Orloff, N. , Long, C. , Williams, D. , Chamberlin, R. , Quinlan, F. , Fortier, T. and Feldman, A. (2020), On-Wafer Metrology of a Transmission Line Integrated Terahertz Source, CLEO: Laser Science to Photonic Applications, San Jose, CA, [online], https://doi.org/10.1364/CLEO_AT.2020.JTu2G.23 (Accessed October 8, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created May 9, 2020, Updated October 15, 2020
Was this page helpful?