Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Conferences

NIST Data Resources for Surface Analysis by X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy

March 1, 2001

Author(s)

Cedric J. Powell, Aleksander Jablonski, A Naumkin, A Kraut-Vass, Joseph M. Conny, J R. Rumble

A description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for x-ray photoelectron spectroscopy

Laser Scanning for Construction Metrology

March 1, 2001

Author(s)

Geraldine S. Cheok, William C. Stone, Robert R. Lipman, Christoph J. Witzgall, Javier Bernal

This paper summarizes work at the National Institute of Standards and Technology (NIST) in the Non-Intrusive Scanning Technologies for Construction Assessment

Computer-Based Wind Design of Low-Rise Buildings: Peak Estimation of Non-Gaussian Wind Effects

March 1, 2001

Author(s)

Fahim Sadek, Emil Simiu

This paper is a condensed version of G2001-1853, Peak Non-Gaussian Wind Effects for Database-Assisted Low-Rise Building Design, for publication in the Journal

Laser-Ultrasonic Methods for Thin-Film Property Measurements Using High-Frequency Surface Acoustic Waves

March 1, 2001

Author(s)

Donna C. Hurley, A J. Richards

Laser-ultrasonic methods to measure thin-film elastic properties have been developed. Surface acoustic waves (SAWs) were generated by a 0.2 ns pulsed laser and

Noncontact Thermometry in the Optical Technology Division at NIST

March 1, 2001

Author(s)

Charles E. Gibson, Howard W. Yoon, Benjamin K. Tsai, Bettye C. Johnson, Robert D. Saunders

The Optical Technology Division (OTD) at the National Institute of Standards and Technology (NIST) maintains the thermodynamic temperature scale above the

In Situ Gas Phase Optical Measurements of Silane Decomposition in a Thermal Chemical Vapor Deposition Reactor

March 1, 2001

Author(s)

James E. Maslar, R W. Davis, Elizabeth F. Moore, Donald R. Burgess Jr., D M. Kremer, S H. Ehrman

Gas phase processes occurring during silicon chemical vapor deposition via silane thermal decomposition were investigated. Raman spectroscopy was utilized to

Some Issues in Quantitative X-Ray Photoelectron Spectroscopy and Auger-Electron Spectroscopy

March 1, 2001

Author(s)

Cedric J. Powell, Joseph M. Conny, Aleksander Jablonski

We give an overview of two issues that are important in quantitative X-ray photoelectron spectroscopy (XPS) and Auger-electron spectroscopy (AES). First, we

Implications and Ramifications of Model-Driven Architecture

March 1, 2001

Author(s)

David W. Flater

The Object Management Group (the consortium that issues the Common Object Request Broker Architecture and Unified Modeling Language standards) is making the

Telepresence Applications in Manufacturing Research and Measurement Services at NIST

March 1, 2001

Author(s)

David C. Stieren

This paper describes applications of and infrastructural technologies for telepresence capabilities within the context of the Information-Based Manufacturing

Frequency Response Metrology for High-Speed Optical Receivers

March 1, 2001

Author(s)

Paul D. Hale, Tracy S. Clement, Dylan F. Williams

There are two types of optical sources whose modulation can be measured or calculated from fundamental principles: the hererodyne beat between two single-

Total Hadamard Variance: Application to Clock Steering by Kalman Filtering

March 1, 2001

Author(s)

David A. Howe, Ron Beard, Chuck Greenhall, Francois Vernotte, Bill Riley

The Total variance approach has been developed for increasing the conﬁdence of the estimation of the classical Allan variance, particularly for large

Precision Measurements of Transport Properties for an Energy Level Fan Diagram of GaAs/AlGaAs in the Integer Quantum Hall Regime

March 1, 2001

Author(s)

J. Matthews, Marvin E. Cage

We present temperature and current dependent measurements of sigma xx} and sigma xy} in the integer quantum Hall effect regime, with a GaAs/AlGaAs

Evaluating Collaborative Enterprises - A Workshop Report

March 1, 2001

Author(s)

Robert Allen, Michelle P. Steves

As part of the WETICE 2001 conference, the workshop on Evaluating Collaborative Enterprises continued from its debut last year exploring the issues surrounding

Fast and Accurate Measurement of the Dispersion of Cascaded Components

March 1, 2001

Author(s)

Shellee D. Dyer, Allen Rose, Kent B. Rochford

We show that the dispersion of multiple cascaded components can be determined from a single low-coherence interferometric measurement. This measurement is not

Wavelength References for 1300 nm and L-Band WDM

March 1, 2001

Author(s)

Tasshi Dennis, William C. Swann, Sarah L. Gilbert

We have surveyed potential references for 1300 nm and L-band wavelength calibration. We have developed a 1314 nm methane reference for our internal calibration

Second Harmonic Magneto-Resistive Imaging to Authenticate and Recover Data From Magnetic Storage Media

March 1, 2001

Author(s)

David P. Pappas, C S. Arnold, G Shalev, C Eunice, D Stevenson, Steven Voran, Mike E. Read, Erin M. Gormley, James Cash, Ken Marr, James Ryan

A scanning magneto-resistive microscope was developed that allows for high resolution imaging of magnetic tapes and digital media. By using second harmonic

Use of Electrical Test Structures to Characterize Trench Profiles Etched on SOI Wafers

March 1, 2001

Author(s)

Nadine Guillaume, J. Kiihamaki, J. Karttunen, H. Kattelus

Interferometric Testing of Photomask Blank Flatness

February 28, 2001

Author(s)

Christopher J. Evans, R E. Parks, L Z. Shao, Tony L. Schmitz, Angela Davies

Conventional interferometric testing of the flatness of photomask blanks is rendered difficult by the long coherence length of the HeNe laser sources typically

Applying X-Ray Topography and Diffractometry to Improve Protein Crystal Growth

February 21, 2001

Author(s)

David R. Black, L Arnowitz, David T. Gallagher

In order to obtain adequate diffraction data to determine the structure of the protein of interest, crystal quality is important. Although in this context there

Superconducting Nb DHEB Mixer Arrays for Far-Infrared Spectroscopy

February 12, 2001

Author(s)

Eyal Gerecht, Carl D. Reintsema, Erich N. Grossman, A. L. Betz, R. T. Boreiko

We are developing a heterodyne focal plane array with up to eight elements to study lines with frequencies of 2 THz and above. It is intended for studies of the

Characterization of a Residential Fire Sprinkler Using Phase Doppler Interferometry.

February 7, 2001

Author(s)

J F. Widmann

The results of a feasibility study to determine if the water sprays produced by residential fire sprinklers can be accurately characterized using phase Doppler

Test Chip for Electrical Linewidth of Copper-Interconnection Features and Related Parameters

February 6, 2001

Author(s)

Michael W. Cresswell, N. Arora, Richard A. Allen, Christine E. Murabito, Curt A. Richter, Ashwani K. Gupta, Loren W. Linholm, D. Pachura, P. Bendix

This paper reports a new electrical test structure for measuring the barrier-layer thickness and total physical linewidth of copper-cored interconnect features

The NIST Manufacturing Engineering Laboratory: Promoting a Healthy U.S. manufacturing Sector Through Measurements and Standards

February 5, 2001

Author(s)

David C. Stieren

The research, measurement and standards activities of the Manufacturing Engineering Laboratory (MEL) at the National Institute of Standards and Technology (NIST

Nanomechanical Characterization of Polymers Using Scanning Probe Microscopes

February 1, 2001

Author(s)

Mark R. VanLandingham

Scanning probe microscopy (SPM) has been used to study polymeric materials with nanometer spatial resolution. Indentation methods based on SPM technology

A Numerical/Experimental Investigation of Microcontamination in a Rotating Disk Chemical Vapor Deposition Reactor

February 1, 2001

Author(s)

R W. Davis, Elizabeth F. Moore, James E. Maslar, Donald R. Burgess Jr., D M. Kremer, S H. Ehrman

Driven by a relentless decrease in feature size, the allowable particle contaminant size during semiconductor fabrication is now less than 100 nm. Particles in

Research on Sealant at the National Institute of Standards and Technology: Past and Present

February 1, 2001

Author(s)

Christopher C. White

The standard test method for evaluating sealant performance is the ASTM C719, which resulted from the pioneering work of NIST researcher Authur Hockman. This

Measurement of Silicon Dioxide Film Thicknesses by X-ray Photoelectron Spectroscopy

February 1, 2001

Author(s)

Cedric J. Powell, Aleksander Jablonski

It is now customary for the effects of elastic-electron scattering to be ignored in measurements of the thicknesses of overlayer films by X-ray photoelectron

Exploring Site Quality Above 1 GHz Using Double Ridged Horns

February 1, 2001

Author(s)

Dennis G. Camell, Robert T. Johnk, K. R. Hall

This is a summary of recent exploratory efforts conducted by the American National Standards Institute (ANSI) Accredited Standards Committee C63, Sub-Committee

Documentary and Physical Standards for Surface Finish and Imperfections

February 1, 2001

Author(s)

Theodore V. Vorburger

Surface finish and imperfections are important properties of optical surfaces because they are caused by manufacturing limitations or defects and are linked to

Imaging of Multi-Fiber, Micro-Mechanical Testing Specimens Using Optical Coherence Tomography

February 1, 2001

Author(s)

Joy P. Dunkers, Gale A. Holmes, Walter G. McDonough

In this initial work, we interfaced a micro-mechanical testing stage with the optical coherence tomography (OCT) instrument. We then demonstrated the