Conferences

Personal Authentication Through Biometric Technologies

January 1, 2002

Author(s)

Fernando L. Podio

¿¿¿Biometric authentication technologies such as face, finger, hand, iris, and speaker recognition are commercially available today and are already in use

Small-Scale Tactile Graphics for Virtual Reality Systems

January 1, 2002

Author(s)

John W. Roberts

¿¿¿As virtual reality technology moves forward, there is a need to provide the user with options for greater realism for closer engagement to the human senses

Video Transmission for Multi-Hop Networks Using IEEE 802.11 FHSS

January 1, 2002

Author(s)

K Ban, Hamid Gharavi

In many applications such as construction, manufacturing, ground robotic vehicles, and rescue operations, there are many issues that necessitate the capability

Reflectance Calibration Standard for Optical Discs

January 1, 2002

Author(s)

Xiao Tang, Jian Zheng

An accurate method for the determination of reflectance of reference discs has been developed at NIST. The discs can be used as a traceable industry standard in

Triggered Image Capture for High Speed Display Characterization

January 1, 2002

Author(s)

John W. Roberts

¿¿¿Precision display measurements often involve the integration of light measurements over many frames. Newer display technologies with high speed light

Human-Robot Interactions: Creating Synergistic Cyber Forces

January 1, 2002

Author(s)

Jean C. Scholtz

Human-robot interaction for mobile robots is still in its infancy. As robots increase in capabilities and are able to perform more tasks in an autonomous manner

Crack Growth in Sapphire

January 1, 2002

Author(s)

Sheldon M. Wiederhorn, Ralph Krause

Crack growth was studied in sapphire on both the m-plane and the r-plane (rhombohedral twin plane). Crack growth on the m-plane fit a power law function of

Position Dependence in the CDMS II Zip Detectors

January 1, 2002

Author(s)

V. Madic, W. Rau, D. S. Akerib, P L. Brink, B. Cabrera, J. P. Castle, C S. Chang, M. B. Crisler, D Driscoll, J Emes, R. J. Gaitskell, J. Hellmig, M E. Huber, J M. Martinis, P. Meunier, T. A. Perera, M C. Perillo Isaac, T. Saab, B. Sadoulet, R. W. Schnee, D N. Seltz, G Z. Wang, B C. Young

The Ge and Si detectors developed by the Cryogenic Dark Matter Search (CDMS) 11 experiment rely on the simultaneous detection of athermal phonons and ionization

Phase Relationships and Phase Formation in the System BaF₂-BaO-Y₂O₃-CuO_x-H₂O

January 1, 2002

Author(s)

Winnie K. Wong-Ng, Lawrence P. Cook, J Suh, Igor Levin, Mark D. Vaudin, Ron Feenstra, James P. Cline

The interplay of melting equilibria and reaction kinetics is important during formation of the Ba2YCu3O6+x (Y-213) phase from starting materials in the

From Promising to Practical: How Standards Help Bring New Materials to the Market

January 1, 2002

Author(s)

Stephen W. Freiman

Let us make a bold statement to begin with. Basedupon numerous conversations with individuals in industry and elsewhere, it is our conclusion that For new

Dendritic Polymer Templates for the Formation of Nanoparticles in Polymer Matrix and their Characterization

January 1, 2002

Author(s)

G Kim, Franziska Grohn, B D. Viers, Barry J. Bauer, C L. Jackson, Eric J. Amis

Prediction of Lateral and Normal Force-Displacement Curves for Flipchip Solder Joints

January 1, 2002

Author(s)

Daniel Wheeler, Daniel Josell, James A. Warren, William E. Wallace

Structural Characterization of Deep Sub-Micron Lithographic Structures using Small-Angle Neutron Scattering

January 1, 2002

Author(s)

Eric K. Lin, Ronald L. Jones, Wen-Li Wu, John Barker, P J. Bolton, G G. Barclay

Dielectric Properties of Multi-layer High-k Composite Films

January 1, 2002

Author(s)

W Sakai, C. K. Chiang

Spatially Heterogeneous Dynamics in Liquids Near Their Glass Transition

January 1, 2002

Author(s)

S C. Glotzer, Y Gebremichael, N Lacevic, T B. Schroder, Francis W. Starr

Colorimetric Characterization of Pearlescent Coatings

January 1, 2002

Author(s)

Maria E. Nadal, Thomas A. Germer

This paper descirbes recent developments at the National Institution of Standards and Technology in the colorimetric characterization of pearlescent coatings

Diffraction Corrections in Radiometry: A Proposed Method to Estimate Uncertainties

January 1, 2002

Author(s)

Eric L. Shirley, Raghu N. Kacker, Raju V. Datla

Radiometric determination of certain quantities, such as source radiance, geometrical aspects of an optical system (e.g., throughput, aperture areas and

Getting Women Into Positions of Leadership Nationally and Internationally

January 1, 2002

Author(s)

K B. Gebbie

The evident under-representation of women in physics has broad implications, particularly for industries and government agencies with a strong need for a

Energy Dispersive X-ray spectromety by Microcalorimetry for the SEM

January 1, 2002

Author(s)

Dale E. Newbury, David A. Wollman, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, John A. Small, John M. Martinis

Analytical x-ray spectrometry for electron beam instruments has been significantly advanced with the development of the NIST microcalorimeter energy dispersive

A Laser Tracker Calibration System

January 1, 2002

Author(s)

Daniel S. Sawyer, Bruce R. Borchardt, Steven D. Phillips, Charles Fronczek, William T. Estler

We describe a laser tracker calibration system developed for frameless coordinate metrology systems. The system employs a laser rail to provide an 'in situ'

Effects of Etching Time and Wafer Miscut on the Morphology of Etched Si(111) Surfaces

January 1, 2002

Author(s)

Hui Zhou, Joseph Fu, S Gonda, Richard M. Silver

In order to meet leading edge and future measurement and calibration needs, NIST has been pursuing the development of atom-based dimensional standards and

Progress in Developing NIST Standard Casings

January 1, 2002

Author(s)

Jun-Feng Song, Theodore V. Vorburger, M Ols

Standard casings and bullets are currently under development to support the National Integrated Ballistics information Network (NIBIN). The master casings are

Wavelength accuracy in WDM: techniques and standards for component characterization

January 1, 2002

Author(s)

Sarah L. Gilbert, Shelley M. Etzel, William C. Swann

Stable, accurately measured wavelength references can be used for wavelength calibration of instruments. We discuss both fundamental and artifact wavelength

Pump-wavelength Dependence of Raman Gain

January 1, 2002

Author(s)

Nathan R. Newbury

The scaling of the Raman gain with pump wavelength is determined by three complimentary techniques: gain comparison at different pump wavelengths, gain

Micromagnetics Simulation of Asymmetric Pseudo-Spin Valve Dots

January 1, 2002

Author(s)

N Dao, C A. Ross, F J. Castano, Michael J. Donahue, S L. Whittenburg

We present our recent simulation results for Ni79Fe21 (5 nm)/Cu (3 nm)/Co (4nm) pseudo-spin valves. These simulations have been conducted on several different

Modeling CPU Demand in Heterogeneous Active Networks

January 1, 2002

Author(s)

V Galtier, Kevin L. Mills, Y Carlinet

tive-network technology envisions deployment of virtual execution environments within network elements, such as switches and routers. As a result, application

Characterizing CDSEM Metrology of 193 nm Resists at Ultra Low Voltage

January 1, 2002

Author(s)

N. Sullivan, M Mastovich, Ronald G. Dixson, P Knutruda, B Bunday, P Febrea, R Brandoma

Resist slimming under electron beam exposure introduces significant measurement uncertainty in the metrology of 193 nm resists. Total uncertainties, which

Deformation of Gauge Blocks

January 1, 2002

Author(s)

Theodore D. Doiron, Eric S. Stanfield, Dennis S. Everett

When a force is exerted on any material, the material deforms. Most of the time the effect is small and is neglected. In the measurement of gauge blocks, where

Stability Analysis of 2-DOF End-Milling for a Range of Radial Immersions

January 1, 2002

Author(s)

P V. Bayly, Tony L. Schmitz, D A. Peters, B P. Mann

Low radial immersion end-milling involves intermittent cutting. If the tool is flexible, its motion in both the x- and y-directions affects the chip load and

Prediction of Surface Location Error by Time Finite Element Analysis and Euler Integration

January 1, 2002

Author(s)

P V. Bayly, Johannes A. Soons, Tony L. Schmitz, Brian S. Dutterer

This paper presents experimental and simulated results for surface location errors in milling. These errors occur due to the inherent flexibility in the