Passive and Active Characterization of Hybrid Glass Substrates for Telecommunication Applications

Published

January 1, 2002

Author(s)

Joseph S. Hayden, Robert D. Simpson, Samuel D. Conzone, Robert K. Hickernell, Berton Callicoatt, Alexana Roshko, Norman Sanford

Abstract

Phosphate glasses have become increasingly popular for planar waveguide devices owing in part to the development of a number of different commercial compositions with a wide range of optical, physical, chemical and laser properties. In addition, the recent development of low temperature bonding technology has made possible the fabrication of structures involving multiple glasses prepared as a single hybrid substrate. Combined, these new materials and technologies make possible the creation of devices with increasing integrity and complexity. Here, we present passive characterization data collected on glass joints prepared with the low temperature bonding technology and active performance data of a hybrid DBR laser where the surface relief grating has been fabricated in the passive glass region of a hybrid substrate.

Proceedings Title

Proc. Intl. Soc. for Optical Engineering (SPIE)

Volume

4645

Conference Dates

January 23-24, 2002

Conference Location

San Jose, CA, USA

Conference Title

SPIE - The International Society for Optical Engineering

Pub Type

Conferences

Keywords

integrated optics, low temperature bonding, optoelectronics, rare-earth-doped glass, rare-earth-doped planar waveguides

Citation

Hayden, J. , Simpson, R. , Conzone, S. , Hickernell, R. , Callicoatt, B. , Roshko, A. and Sanford, N. (2002), Passive and Active Characterization of Hybrid Glass Substrates for Telecommunication Applications, Proc. Intl. Soc. for Optical Engineering (SPIE), San Jose, CA, USA (Accessed October 2, 2025)