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PUBLICATIONS

Broad-band Characterization of High-Dielectric Constant Films.for Power-Ground Decoupling

Published

Author(s)

Jan Obrzut, N Noda, R Nozaki
Conference Location
Undefined
Conference Title
IEEE Transactions on Instrumentation and Measurements 2002; 51(4): 829-832.
Pub Type
Conferences

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Keywords

Dielectric Properties, coaxial discontinuity, dielectric permittivity, embedded decoupling capacitance, high dielectric constant films, microwave measurements, polymer composites

Citation

Obrzut, J. , Noda, N. and Nozaki, R. (2002), Broad-band Characterization of High-Dielectric Constant Films.for Power-Ground Decoupling, IEEE Transactions on Instrumentation and Measurements 2002; 51(4): 829-832., Undefined, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853738 (Accessed October 5, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2001, Updated October 12, 2021