TY  - CONF
AU  - Jan Obrzut
AU  - N Noda
AU  - R Nozaki
C2  - IEEE Transactions on Instrumentation and Measurements 2002; 51(4): 829-832., Undefined
DA  - 2002-01-01 00:01:00
LA  - en
PB  - IEEE Transactions on Instrumentation and Measurements 2002; 51(4): 829-832., Undefined
PY  - 2002
TI  - Broad-band Characterization of High-Dielectric Constant Films.for Power-Ground Decoupling
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853738
ER  -