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Conferences

Dependence Characteristics of Face Recognition Algorithms

Author(s)
Andrew L. Rukhin, Patrick J. Grother, P J. Phillips, Stefan D. Leigh, E M. Newton, Nathanael A. Heckert
Nonparametric statistics for quantifying dependence between the output rankings of face recognition algorithms are described. Analysis of the archived results

Colorimetric Characterization of Pearlescent Coatings

Author(s)
Maria E. Nadal, Thomas A. Germer
This paper descirbes recent developments at the National Institution of Standards and Technology in the colorimetric characterization of pearlescent coatings

Energy Dispersive X-ray spectromety by Microcalorimetry for the SEM

Author(s)
Dale E. Newbury, David A. Wollman, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, John A. Small, John M. Martinis
Analytical x-ray spectrometry for electron beam instruments has been significantly advanced with the development of the NIST microcalorimeter energy dispersive

Reflectance Calibration Standard for Optical Discs

Author(s)
Xiao Tang, Jian Zheng
An accurate method for the determination of reflectance of reference discs has been developed at NIST. The discs can be used as a traceable industry standard in

A Laser Tracker Calibration System

Author(s)
Daniel S. Sawyer, Bruce R. Borchardt, Steven D. Phillips, Charles Fronczek, William T. Estler
We describe a laser tracker calibration system developed for frameless coordinate metrology systems. The system employs a laser rail to provide an 'in situ'
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