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Conferences

Nanometer-Scale Pores: Potential Applications for Analyte Detection and DNA Characterization

October 1, 2002

Author(s)

John J. Kasianowicz

Several classes of transmembrane protein ion channels function in vivo as sensitive and selective detection elements for analytes. Recent studies on single...

Acoustic Damping in Langatate as a Function of Temperature, Frequency, and Mechanical Contact

October 1, 2002

Author(s)

Ward L. Johnson, Sudook A. Kim, Damian S. Lauria, R C. Smyth

Resonant acoustic damping in plano-convex (trapped-mode) langatate (La 3Ga 5.5Ta0 0.50 14) discs was measured at frequencies from 2 MHz to 18 MHz and...

The NIST Low Temperature ITS-90 Realization and Calibration Facilities

October 1, 2002

Author(s)

Christopher W. Meyer, Weston L. Tew

Two facilities have been constructed at NIST for realizing and maintaining the ITS-90 below 84 K. The first facility is an integrated low temperature...

Thermal Modeling of Multiple-Line-Heat-Source Guarded Hot Plate Apparatus

October 1, 2002

Author(s)

William M. Healy, D R. Flynn

The National Institute of Standards and Technology is building an advanced-design guarded hot plate apparatus of advanced design to provide very accurate...

An International Study of Guarded Hot Plate Laboratories Using Fibrous Glass and Expanded Polystyrene Reference Materials

October 1, 2002

Author(s)

Robert R. Zarr, James J. Filliben

Thermal conductivity measurements of four thermal insulation reference materials are presented. The measurements were obtained from an international study of...

Application of Self-Assembled Technology to Probe Fiber Matrix-Adhesion

October 1, 2002

Author(s)

E Feresenbet, D T. Raghavan, Gale A. Holmes

Adhesion at the fiber-matrix interface of composite is often related to a combination of factors such as mechanical interlocking, physico-chemical interactions...

Applications Panel: Agents Applied to Autonomous Vehicles

October 1, 2002

Author(s)

Craig I. Schlenoff

In order to make an unmanned vehicle drive truly autonomously, many different software components are needed. Each of these components is tasked with providing...

Using HMMs to Quantify Signals from DNA Driven Through a Nanometer Scale Pore

October 1, 2002

Author(s)

Vincent M. Stanford, John J. Kasianowicz

It was recently shown that individual molecules of single-stranded DNA can be forced through a nanoscale pore by an electric field. We demonstrate signal...

Living and Working with Ubiquitous Computing

October 1, 2002

Author(s)

Jean C. Scholtz

Today, much of our information-intensive work is carried out at desktop computer workstations; however, increasingly people work and live on the move. Very soon...

The Development and Evolution of TREC and DUC

October 1, 2002

Author(s)

Donna K. Harman

The Text REtrieval Conference (TREC) has been running for 11 years now, with 93 participants in the last round of evaluation. This paper chronicles the changes...

Superconformal Film Growth

October 1, 2002

Author(s)

Thomas P. Moffat, Daniel Wheeler, Daniel Josell

Superconformal electrodeposition of copper is explained by the recently developed curvature enhanced accelerator coverage (CEAC) mechanism. The model stipulates...

Nanoporous Polymer Film Properties From Brillouin Light Scattering and Surface Acoustic Wave Spectroscopy

October 1, 2002

Author(s)

Colm Flannery, Sudook A. Kim, T Wittkowski, K Y. Jung, B Hillebrands, M R. Baklanov

Nanoporous Methylsilsesquioxane polymer films have outstanding potential forapplication to microelectronic interconnect, because of their low dielectric...

Elastic Properties of Hardness Coatings Using Surface Acoustic Wave Spectroscopy

October 1, 2002

Author(s)

Donna C. Hurley, A J. Richards, Vinod K. Tewary, A Bendavid, P J. Martin

Surface acoustic wave (SAW) spectroscopy is a nondestructive way to determine the properties of thin films. Plane-wave SAWs are generated by a line-focused...

Low Scatter Optical System for Emittance and Temperature Measurements

October 1, 2002

Author(s)

Sergey Mekhontsev, Leonard M. Hanssen

The development and evaluation of an optical system for a new spectral directional emittance facility at NIST is reported. The imaging quality and signal...

The NIST Data Gateway: Providing Easy Access to NIST Data Resources

October 1, 2002

Author(s)

D M. Blakeslee, Angela Y. Lee, A J. Belsky

The National Institute of Standards and Technology (NIST) maintains a wide range of scientific and technical data resources, including free online data systems...

An Analytical Approach to Shared Backup Path Provisioning in GMPLS Networks

October 1, 2002

Author(s)

Sanghun Lee, David W. Griffith, N-O Song

As GMPLS and its supporting set of protocols develop into a viable control plane for optical networks, an important function that they will need to support will...

Design Concepts for a New Guarded Hot Plate Apparatus for Use Over an Extended Temperature Range

October 1, 2002

Author(s)

D R. Flynn, Robert R. Zarr, Mahn-Hee Hahn, William M. Healy

The National Institute of Standards and Technology is building a new guarded hot plate apparatus (GHP) for use at temperatures from 90 K to 900 K, with...

Merging Weather Data With Materials Response Data During Outdoor Exposure

October 1, 2002

Author(s)

R S. Williams, A A. Sanadi, Corey C. Halpin, Christopher C. White

As part of an outdoor exposure protocol for a studying the weathering of sealants, a full weather station was installed at the Forest Products Laboratory field...

Research and Challenges of Multi-Scale Mechanics and Modeling

October 1, 2002

Author(s)

K P. Chong, Nicos Martys

One of the great challenges in the material sciences is to predict long term performance of materials and structures. Recent efforts have focused on linking...

Embedded Real-Time Linux For Cable Robot Control

October 1, 2002

Author(s)

Frederick M. Proctor, William P. Shackleford

Linux is a version of the Unix operating system distributed according to the open source model. Programmers are free to adapt the source code for their purposes...

Cost Effective Use of Formal Methods in Verification and Validation Foundations

October 1, 2002

Author(s)

D. Richard Kuhn, Ramaswamy Chandramouli, R W. Butler

Formal methods offer the promise of significant improvements in verification and validation, and may be the only approach capable of demonstrating the absence...

Cost Effective Uses of Formal Methods in Verification and Validation

October 1, 2002

Author(s)

D. Richard Kuhn, Ramaswamy Chandramouli

Formal methods offer the promise of significant improvements in verification and validation, and may be the only approach capable of demonstrating the absence...

Dynamic Analysis of Sliding Contacts at Head-Disk Interface

October 1, 2002

Author(s)

Tze J. Chuang, Stephen M. Hsu

As magnetic data storage technology moves towards higher areal data density with higher rotational speeds and lower flying heights, the propensity of severe...

An IDEF1X Information Model for a Supply Chain Simulation

October 1, 2002

Author(s)

Yung-Tsun Lee, Shigeki Umeda

This paper describes the scope and configuration of the simulation model that is under development for a manufacturing supply chain. An information model that...

An Architecture for a Generic Data-Driven Machine Shop Simulator

October 1, 2002

Author(s)

Charles R. McLean, Albert T. Jones, Yung-Tsun Lee, Frank H. Riddick

In most cases, the effort required to develop a meaningful simulation for a small machine shop exceeds the resources available. Small shops typically do not...

Testing STEP-NC Implementations

October 1, 2002

Author(s)

Allison Barnard Feeney, Simon P. Frechette

STEP (STandard for the Exchange of Product model data, ISO 10303) data for numerical control, or STEP-NC, is intended to provide full product and process data...

Atomic Force Microscopy of Semiconductor Line Edge Roughness

October 1, 2002

Author(s)

N G. Orji, Jayaraman Raja, Theodore V. Vorburger

Over the last two decades the width of patterned lines on semiconductor devices has continuously decreased. Based on technology trends predicted by the...

Non-contact Electrical Critical Dimensions Metrology Sensor for Chrome Photomasks

October 1, 2002

Author(s)

Nadine Guillaume, Markku Lahti, Michael W. Cresswell, Richard A. Allen, Loren W. Linholm, Mona E. Zaghloul

A Tool to Improve Efficiency in Large Scale Manufacturing

September 25, 2002

Author(s)

Roger V. Bostelman, William P. Shackleford, Frederick M. Proctor, James S. Albus, Alan M. Lytle

NIST is working directly with industry to improve repair and conversion operations of ships in dry dock. Similarly, this work allows transfer of technology to...

Concept of the Robotoid Manager With AR.

September 23, 2002

Author(s)

T Bock, S Ashida

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