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Conferences

What Do the Specifications Mean?

Author(s)
Edward F. Kelley
Specifications and "specsmanship" continue to confuse people despite the fact that a solid metrological basis exists for communicating display performance. We

Feasibility Study for the Development of a Motion Imagery Quality Metric

Author(s)
J Irvine, Charles D. Fenimore, D Cannon, John W. Roberts, S Israel, L Simon, C Watts, J Miller, A I. Aviles, P F. Tighe, R J. Behrens
The motion imagery community would benefit from the availability of standard measures for assessing image interpretability. The National Imagery

A Coarse/Fine Motion Control Stage; Preliminary Studies

Author(s)
H Yang, E S. Buice, T J. Fagan, Stephen J. Smith, R Hocken, D L. Trumper, Richard Seugling
We are developing a stage system, which uses a coarse/fine approach for accurate nanometer level positioning for scanning specimens over an area measuring 50 mm

Task Analysis of Autonomous On-Road Driving

Author(s)
Anthony J. Barbera, John A. Horst, Craig I. Schlenoff, David Aha
The Real-time Control System (RCS) Methodology has evolved over a number of years as a technique to capture task knowledge and organize it into a framework

The era of coherent optical frequency references

Author(s)
Leo W. Hollberg, Christopher W. Oates, Scott Diddams, G Wilpers, A Bartels, C Hoyt, Zeb Barber
The past four years have shown a dramatic improvement in the performance of optical frequency references and in the methods by which they are calibrated and

Standard Radiometers and Targets for Microwave Remote Sensing

Author(s)
James P. Randa, Amanda Cox, Dave K. Walker, Michael H. Francis, Katherine MacReynolds, Jeffrey R. Guerrieri
We describe the NIST effort to develop brightness-temperature standards for microwave and millimeter-wave frequencies. Results of preliminary measurements at 26

Ensuring High Quality Data Transfer Standards

Author(s)
Arthur Griesser
Quality data transfer standards are necessary for effective communication between equipment provided by different vendors. Like other complex activities

Measuring the Performance of XML-Based Data Standards

Author(s)
Eric D. Simmon, Gino Crispieri
The semiconductor fabrication plant floor is a constantly changing environment. As equipment and fabrication process complexity increases, larger quantities of

Pose of I-Beams for Construction Site Automation

Author(s)
David E. Gilsinn, Geraldine S. Cheok, Alan M. Lytle
Automation of construction processes can result in reduced project costs and increased worker safety. A process that lends itself to automation is the picking

Errors due to the reflectivity of calibration targets

Author(s)
James P. Randa, Dave K. Walker, Amanda Cox, Robert L. Billinger
For a microwave total-power radiometer, we consider the error introduced by neglecting the difference in the antenna reflection coefficient between when it

R-22 Replacement Status (in Chinese)

Author(s)
J M. Calm, Piotr Domanski
Since its initial recognition in 1928 and commercialization in 1936, R-22 has been applied in systems ranging from the smallest window air conditioners to the

Semiconductor Metrology Programs at NIST

Author(s)
Joaquin (. Martinez, Stephen Knight
The history of the National Bureau of Standards/National Institute of Standards and Technology (NBS/NIST) will be briefly reviewed emphasizing the creation of
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