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Conferences

The NIST Time Measurement and Analysis Service

August 7, 2006

Author(s)

Michael A. Lombardi, Andrew N. Novick

NIST now offers a new remote calibration service designed to assist laboratories who maintain a accurate local time standard. The service monitors the local

Preliminary Studies of Electromagnetic Properties of Microwave Absorbing Materials used in Calibration Targets

August 4, 2006

Author(s)

Amanda Cox, Michael D. Janezic

As part of the ongoing effort at NIST to develop a microwave brightness temperature standard, we are exploring the electromagnetic and thermal characteristics

Proposed Development of a National Standard for Microwave Brightness Temperature

August 4, 2006

Author(s)

James P. Randa, Amanda Cox, Dave K. Walker

We review the advantages of a national standard for microwave brightness temperature and outline our proposed approach toward developing such a standard. The

Initial Results from the Infrared Calibration and Infrared Imaging of a Microwave Calibration Target

August 4, 2006

Author(s)

Amanda Cox, Joseph O'Connell, Joseph P. Rice

Measurement of Tissue Engineering Scaffolding Material

August 2, 2006

Author(s)

John G. Hagedorn, John T. Kelso, Joy P. Dunkers

In-Situ Measurement of the Moisture Content of Building Materials Using Ultra-Wideband Radio Waves

August 1, 2006

Author(s)

William M. Healy

A study was carried out to determine the feasibility of commercial, off-the-shelf, and potentially low-cost ultra-wideband radio hardware to serve as a

A Concept Prototype for Integrated Gaming and Simulation for Incident Management

August 1, 2006

Author(s)

Sanjay Jain, Charles R. McLean

This paper describes a prototype that has been developed to demonstrate the concept of integrated gaming and simu-lation for incident management. An

Evaluating Suitability for Replacement of an Integrated Software Component

August 1, 2006

Author(s)

Boonserm Kulvatunyou, B Jeong, Hyunbo Cho, Nenad Ivezic, Albert W. Jones

An evaluation of the compatibility of a software component is based typically only on a vendor?s presentation. This means that end users select a software

Feature Technology and Ontology for Embedded System Design and Development

August 1, 2006

Author(s)

XuanFang Zha, Ram D. Sriram

In this paper, we present our recent effort on using a feature technology and ontology for embedded systems modeling and design. We present an overview of

A Validation Architecture for Advanced Interoperability Provisioning

August 1, 2006

Author(s)

Nenad Ivezic, Edward J. Barkmeyer Jr., Boonserm Kulvatunyou, Albert W. Jones, Pat Snack, Zuran Marjanovic, Hyunbo Cho

We describe an architecture to validate new tools in support of interoperability provisioning processes that take place within industrial communities. We start

A Core Manufacturing Simulation Data Information Model for Manufacturing Applications

August 1, 2006

Author(s)

Swee K. Leong, Yung-Tsun T. Lee, Frank H. Riddick

Simulation technology has been demonstrated to be an effective tool for reducing costs, improving quality, and shortening the time-to-market for manufactured

Effects of Using an Unshielded Cable as a Reference Standard in Cable Shielding Measurements, or, Do You Really Want to Base Your Results on a Naked Cable?

August 1, 2006

Author(s)

Jason B. Coder, John M. Ladbury

We examine the effects of using an unshielded cable as a reference standard for the evaluation of the high-frequency shielding effectiveness of cables. We

National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report

August 1, 2006

Author(s)

Michael T. Postek, Richard R. Cavanagh, C M. Allocca, Douglas T. Smith, Robert D. Shull, David A. Wollman, David G. Seiler, Stephen Knight, A Diebold, Richard M. Silver, Charles W. Clark, Kevin W. Lyons, James R. Whetstone, Ronald F. Boisvert

Measurement Techniques of Low Value High Current Single Range Current Shunts 15 Amps to 3000 Amps

August 1, 2006

Author(s)

Marlin E. Kraft

Standard resistors that are used to measure current and are designed to dissipate relatively high levels of power are known as current shunts. This paper will

An Overview of the Josephson Voltage Standard Interlaboratory Comparison

August 1, 2006

Author(s)

Yi-hua Tang

A majority of Josephson Voltage Standard (JVS) interlaboratory comparisons have been performed by using Zener voltage transfer standards and a protocol based on

Polarization Recovery and Auto-compensation in Quantum Key Distribution Network

August 1, 2006

Author(s)

Lijun Ma, Hai Xu, Xiao Tang

A Quantum Key Distribution (QKD) network can allow multi-user communication via secure key. Moreover, by actively switching communication nodes, one can achieve

Multiple Description Video Coding over Multiple Path Routing Networks

August 1, 2006

Author(s)

Shaoshuai Gao, Hamid Gharavi

This paper presents a multiple description (MD) video-coding scheme, which uses interlaced high signal to noise ratio (H-SNR) and low signal to noise ratio (L

Schottky-contact Silicon Nanowire Field Effect Transistor Test Structures

August 1, 2006

Author(s)

Sang-Mo Koo, Curt A. Richter, Qiliang Li, Monica D. Edelstein, Eric M. Vogel

Precise Manipulation and Alighment of Single Nanowires for Device Fabrication

August 1, 2006

Author(s)

Qiliang Li, Sang-Mo Koo, Curt A. Richter, Monica D. Edelstein, Joseph Kopanski, John S. Suehle, Eric M. Vogel

Interface Characterization of Molecular-Monolayer/SiO2 Based Molecular Junctions

August 1, 2006

Author(s)

Curt A. Richter, Christina Hacker, Lee J. Richter, Oleg A. Kirillov, Eric M. Vogel

The properties of monolayers of molecules on thin SiO2 are of great interest for future hybrid Si-molecular device technologies. We present here a correlation

Temperature and Pressure Coefficients of Thomas 1 Ohm Resistors

August 1, 2006

Author(s)

George R. Jones Jr., Randolph Elmquist

In preparing to move the precision 1 ohm measurement service to the new Advanced Measurement Laboratory (AML) in the spring of 2004, staff at the National

The NIST Advanced Measurement Laboratory: at the Leading Edge of Measurement Science and Technology

August 1, 2006

Author(s)

C Londono, John Lawall, Michael T. Postek, Jack A. Stone Jr., John R. Stoup

The National Institute of Standards and Technology as the U.S. National Metrology Institute has the fundamental responsibility to continuously push the limits

Second Symposium on Pendulum Impact Machines: Procedures and Specimens

August 1, 2006

Author(s)

Thomas A. Siewert, Christopher N. McCowan, M. P. Manahan

This publication consists primarily of the papers presented at the Second Symposium on Pendulum Impact Machines: Procedures and Specimens, sponsored by ASTM

Comparing Numerical and Experimental Results for the Shielding Properties of a Doubly-Periodic Array of Apertures in a Thick Conducting Screen

August 1, 2006

Author(s)

Derik Love, John M. Ladbury, Edward J. Rothwell

The application of mode-matching to determine the shielding properties of thick screens containing a doubly-periodic array of apertures has been demonstrated

An Infrastructure to Support Performance Analysis in Complex Systems

August 1, 2006

Author(s)

Man-Sze Li, A S. Deshmukh, Albert T. Jones

Systems research efforts have increased in a variety of disciplines. Despite these efforts, it is still difficult to predict long-term performance and to

Concrete Multiplicative Complexity of Symmetric Functions

August 1, 2006

Author(s)

Joan Boyar, Rene Peralta

The multiplicative complexity of a Boolean function f is defined as the minimum number of binary conjunction (AND) gates required to construct a circuit

The LAGR Project. Integrating learning into the 4D/RCS Control Hierarchy

August 1, 2006

Author(s)

James S. Albus, Roger V. Bostelman, Tsai H. Hong, Tommy Chang, William P. Shackleford, Michael O. Shneier

The National Institute of Standards and Technology?s (NIST) Intelligent Systems Division (ISD) is a par-ticipant in the Defense Advanced Research Project Agency

Demonstration of an Active Quantum Key Distribution Network

August 1, 2006

Author(s)

Xiao Tang, Lijun Ma, Alan Mink, Anastase Nakassis, Hai Xu, Barry J. Hershman, Joshua Bienfang, David H. Su, Ronald Boisvert, Charles W. Clark, Carl J. Williams

We previously demonstrated a high speed, point to point, quantum key distribution (QKD) system with polariztion coding over a fiber link, in which the resulting

Spectral phase dependence of phase noise of stabilized optical frequency combs

July 31, 2006

Author(s)

Qudsia Quraishi, Scott A. Diddams, Leo W. Hollberg

We present the spectral dependence of the phase noise between two optical frequency combs which are frequency shifted from each other by their offset

High-resolution spectral fingerprinting with a stabilized femtosecond laser frequency comb

July 31, 2006

Author(s)

Scott A. Diddams, Leo W. Hollberg, Vela Mbele

We demonstrate a novel optical spectroscopy technique combining a stabilized femtosecond frequency comb with a spectrometer that resolves individual comb

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