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Conferences

Spatial Probing of Traps in nMOSFET with ALD HfO2/SiO2 Stacks Using Low Frequency Noise Characteristics

October 15, 2006

Author(s)

Hao Xiong, John S. Suehle

Low frequency (LF) noise is studied in nMOSFET with various HfO2 dielectric or interfacial layer (IL) thickness and TiN as gate electrode material. LF noise...

Performance Metrics for Intelligent Systems (PerMIS) 2006 Workshop: Summary and Review

October 13, 2006

Author(s)

Rajmohan Madhavan, Elena R. Messina

The Performance Metrics for Intelligent Systems (PerMIS 2006) workshop was held during August 21-23, 2006 at the National Institute of Standards and Technology...

Automatic Message Classification

October 11, 2006

Author(s)

Arthur Griesser

Rising automation means fewer humans, maintaining more equipment, which is exchanging more information. This information torrent is expected to increase even...

RF, Analog, and Mixed Signal Technologies for Communication ICs - An ITRS Perspective

October 10, 2006

Author(s)

Margaret Huang, Herbert S. Bennett, Julio Costa, Peter Cotrell, Anthony A. Immorlica, Jan-Erik Meuller, Charles E. Weitzel, Marco Racaneli, Hisashi Schichijo, Bin Zhao

The International Technology Roadmap for Semiconductor (ITRS) Radio Frequency and Analog/Mixed-Signal (RF and AMS) Wireless Technology Working Group (TWG)...

Microfluidic-Directed Molecular Self-Assembly and Templating of Bio-Inspired Nanoparticles

October 7, 2006

Author(s)

Wyatt N. Vreeland, Jennifer S. Hong, Andreas Jahn, Srinivasa R. Raghavan, Laurie E. Locascio, Michael Gaitan

Applications of a 3D Range Camera Towards Healthcare Mobility Aids

October 3, 2006

Author(s)

Roger V. Bostelman, Peter Russo, James S. Albus, Tsai Hong Hong, Rajmohan Madhavan

The National Institute of Standards and Technology (NIST) has recently studied a new 3D range camera for use on mobile robots. These robots have potential...

Standard Product Models for Supporting Automated Erection of Structural Steelwork

October 3, 2006

Author(s)

Robert R. Lipman, Vineet Kamat

A piece of automation equipment such as a robotic crane for steel erection has no intrinsic knowledge of the process it automates. Thus, geometric and spatial...

Quantitative, Interactive Measurement of Tissue Engineering Scaffold Structure in an Immersive Visualization Environment

October 2, 2006

Author(s)

John G. Hagedorn, Joy P. Dunkers, Adele P. Peskin, John T. Kelso, Lori Henderson, Judith E. Terrill

We describe a software system that enables the measurement and analysis of tissue engineering scaffold materials from three dimensional images. Essential to...

Imaging and Spectroscopy at Terahertz Frequencies Using Hot Electron Bolometer Technology

October 2, 2006

Author(s)

Eyal Gerecht, Dazhen Gu, Fernando Rodriquez-Morales, Sigfrid Yngvesson

Imaging and spectroscopy at terahertz frequencies (defined roughly as 300 GHz-3 THz) have great potential for both healthcare and homeland security applications...

COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS AS DETERMINED BY XRD AND EBSD

October 2, 2006

Author(s)

Jens Mueller, Davor Balzar, Roy H. Geiss, David T. Read, Robert Keller

Texture in materials has a large influence on many properties of thin films; it is customarily determined by neutron or X-ray diffraction by measuring pole...

Programmable Active Services for SIP

October 1, 2006

Author(s)

Jean Deruelle, Mudumbai Ranganathan, Douglas C. Montgomery

We have implemented a quantum key distribution (QKD) system with polarization encoding at 850 nm over 1 km of optical fiber. The high-speed management of the...

RFID-Assisted Indoor Localization and Communication for First Responders

October 1, 2006

Author(s)

Jeffrey R. Guerrieri, Michael H. Francis, Perry F. Wilson, Leonard E. Miller, Nelson Bryner, David Stroup, Luke Klien-Berndt

An indoor localization and communication project is described that proposes to use RFID (radio-frequency identification) tags, placed in the building beforehand...

Simulation Prototypes for Incident Management Training

October 1, 2006

Author(s)

Guodong Shao, Charles R. McLean

First responders and incident management personnel need better training resources to prepare for future disasters. Live training exercises while valuable are...

Determination of Cross-Polarization Parameters in the Presence of Drift in Radar Cross Section Measurements

October 1, 2006

Author(s)

Lorant A. Muth

We use a rotating dihedral to determine the cross-polarization ratios of radar cross section measurement systems. Even a small amplitude drift can severely...

Generalized Test Bed for High-Voltage, High-Power SiC Device Characterization

October 1, 2006

Author(s)

David W. Berning, Allen R. Hefner Jr., J J. Rodriguez, Colleen E. Hood, Angel Rivera

A generalized 25 kV test bed developed to characterize high-voltage, high-power SiC devices is described. The test bed features containment of all high voltage...

Three-Antenna Extrapolation Gain Measurement System at Millimeter Wave Frequencies

October 1, 2006

Author(s)

Katherine MacReynolds, Jeffrey R. Guerrieri, Michael H. Francis, Douglas T. Tamura

This paper describes the new tabletop millimeter wave extrapolation range which will provide on-axis gain services up to 110GHz. A discussion of the...

A Model-Driven Approach for Building OWL DL and OWL Full Ontologies

October 1, 2006

Author(s)

S Brockmans, R Colomb, P Haase, E Kendall, Evan K. Wallace, G Xie

This paper presents an approach for visually modeling OWL DL and OWL Full ontologies based on the well-established visual modeling language UML. We discuss a...

Unsupervised Anomaly Detection System Using Next-Generation Router Architecture

October 1, 2006

Author(s)

Richard A. Rouil, Nicolas Chevrollier, Nada T. Golmie

Unlike many intrusion detection systems that rely mostly on labeled training data, we propose a novel technique for anomaly detection based on unsupervised...

Recent Advances in High-Voltage, High-Frequency Silicon-Carbide Power Device

October 1, 2006

Author(s)

Allen R. Hefner Jr., Ryu Sei-Hyung, Hull Brett, David W. Berning, Colleen E. Hood, Jose M. Ortiz-Rodriguez, Angel Rivera-Lopez, Tam H. Duong, Adwoa Akuffo, Madelaine H. Hernandez

The emergence of High-Voltage, High-Frequency (HV-HF) Silicon-Carbide (SiC) power devices is expected to revolutionize commercial and military power...

A New Critical Dimension Metrology for Chrome-on-Glass Substrates Based ons-Parameter Measurements Extracted from Coplanar Waveguide Test Structures

October 1, 2006

Author(s)

Chidubem Nwokoye, Mona E. Zaghloul, Michael W. Cresswell, Richard A. Allen, Christine E. Murabito

In mask fabrication, Critical Dimension (CD) metrology is conducted by optical transmission, Scanning Electron Microscopy (SEM), and Atomic Force Microscopy...

Time-correlated single-photon counting with superconducting single-photon detectors

October 1, 2006

Author(s)

Martin Stevens, Robert Hadfield, Robert E. Schwall, Sae Woo Nam, Richard Mirin

We report use of a niobium nitride superconducting single-photon detector in a time-correlated single-photon counting experiment. The detector has a timing...

Josephson Voltage Standards Comparison Between CENAM and NIST at 10 V Level

October 1, 2006

Author(s)

Dionisio Hernandez, Enrique Navarette, David Aviles, Yi-hua D. Tang

A comparison of Josephson Voltage Standards (JVS) between the National Institute of Standards and Technology (NIST) and the Centro Nacional de Metrologia (CENAM...

Underpotential Co-Deposition of Cu_subscript(1-x)Pt_subscript(x) Alloys

September 30, 2006

Author(s)

J Mallett, Ugo Bertocci, Erik B. Svedberg, John Bonevich, Alexander J. Shapiro, William F. Egelhoff Jr., Thomas Moffat

The electrodeposition of Cu_subscript (1-x)Pt_subscript(x) alloys by underpotential co-deposition of Cu with Pt is demonstrated using an H_subscript(2)SO...

Advancing Towards Factory-Wide Data Quality for APC Applications

September 30, 2006

Author(s)

Harvey Wohlwend, Gino Crispieri, Ya-Shian Li-Baboud

Advancing to the next levels of Advanced Process Control (APC) requires the ability to intelligently merge existing and new data sources in order to refine...

Practical Aspects Impacting Time Synchronization Data Quality in Semiconductor Manufacturing

September 30, 2006

Author(s)

James Moyne, Jonathan Parrott, Naveen Kalappa, Ya-Shian Li-Baboud

In this presentation, the practical aspects of implementing time synchronization in today?s fabs will be discussed utilizing experimental analysis of industrial...

Carbon Based Coatings for Thermal Detectors: Laser Damage and Thermal Efficiency

September 25, 2006

Author(s)

Krishna Ramadurai, Laura H. Lewis, Christopher L. Cromer, Roop Mahajan, Katie Hurst, John H. Lehman

The laser damage threshold and absorption efficiency of a variety of carbon based thermal coatings for laser power and energy measurements have been...

Contamination and Decontamination of Building Plumbing Systems

September 25, 2006

Author(s)

Stephen J. Treado, Mark A. Kedzierski, Stephanie S. Watson, Kenneth D. Cole

The quality of drinking water has always been a subject of interest. In fact, a stable and secure supply of clean drinking water is a hallmark of modern society...

Excimer Laser Treatment for Purification of Bulk Carbon Single-Walled Nanotubes and Damage of Carbon Allotropes

September 25, 2006

Author(s)

Katie Hurst, Darryl A. Keenan, Anne Dillon, John H. Lehman

Laser treatment of bulk carbon single-walled nanotubes (SWNTs) using an excimer laser is demonstrated as a potentially simple and fast purification method...

Damage of thermal detector platforms based on metal-carbon nanotube composites

September 25, 2006

Author(s)

Laurence Lewis, Christopher L. Cromer, Krishna Ramadurai, Roop Mahajan, John H. Lehman

Today's standards for laser power and energy measurements are inadequate for tomorrow's high efficiency diode and fiber lasers. To meet this need, a new...

The NIST Advance Measurement Laboratory: At the Leading Edge of Measurement Science and Technology

September 20, 2006

Author(s)

C Londono, John R. Lawall, Michael T. Postek, Jack A. Stone Jr., John R. Stoup

The National Institute of Standards and Technology as the U.S. National Metrology Institute has the fundamental responsibility to continuously push the limits...

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