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Blaza Toman, Adriana Hornikova, Robert C. Hagwood, Hung-Kung Liu, Nien F. Zhang, Edward J. Garboczi, Jeffrey W. Bullard
Virtual measurements are the outputs of well-defined mathematical models based on theoretical principles and simulation algorithms. The VCCTL (Virtual Cement
The measurement of the evolution of mechanical characteristics during the setting period of concrete is needed to control the schedule of construction (pumping
The design of concrete with specified properties for an application is not a new science, but it has taken on a new meaning with the wide use of special
Effective link layer triggering is key in order to enable fast and reliable handover across different access networks. In this paper, we investigate the use of
Roger V. Bostelman, Tsai Hong Hong, Tommy Chang, William P. Shackleford, Michael O. Shneier
The National Institute of Standards and Technology s (NIST) Intelligent Systems Division (ISD) is working with the material handling industry, specifically on
Christopher L. Holloway, Galen H. Koepke, Dennis G. Camell, Kate Remley, S. A. Schima, Dylan Williams
For various applications, there is a growing need to understand the shielding and/or attenuation properties of large buildings and structures. In this paper, we
Kenneth A. Snyder, Raymond D. Mountain, Antonio Faraone
A computational toolkit is being developed for studying materials relevant to portland cement hydration. The toolkit will eventually include both a materials
This work reports on search engine use by intelligence analysts, generally considered experts at the task of searching for information. Intelligence analysts
William E. Wallace, Charles M. Guttman, Kathleen M. Flynn, Anthony J. Kearsley
We present a strategy to create an absolute molecular mass distribution polymer Standard Reference Material. To create a standard our methods must be free of
Stuart W. Katzke, Keith A. Stouffer, Marshall Abrams, David Norton, Joe Weiss
The National Institute of Standards and Technology (NIST) has established an Industrial Control System Security Project to improve the security of public and
Uniform sample illumination via K hler illumination, is achieved by establishing a pair of conjugate focal planes; a light source is focused onto the condenser
The National Institute of Standards and Technology (NIST) Intelligent Systems Division (ISD) has been working on a healthcare mobility system capable of
Software testing and maintenance tools must yield widely accepted assurance information in a standardized form. We can then use this information as evidence to
Kate Remley, M. Myslinski, Dominique Schreurs, Bart Nauwelaers
This work presents for the first time wideband Large Signal Network Analyzer (LSNA) measurements used to extract a large-signal behavioral model of an RF
We review the advantages of a national standard for microwave brightness temperature and outline our proposed approach toward developing such a standard. The
Arry Bussiba, Philippe P. Darcis, J D. McCloskey, Christopher N. McCowan, Thomas A. Siewert, Gabriel Kohn, R P. Smith, J. Merritt
This study presents fatigue data for six different pipeline steels, with strengths ranging from Grade B to X100. A fatigue crack growth test for full-thickness
Philippe P. Darcis, Joseph D. McColskey, Christopher N. McCowan, Thomas A. Siewert, Gabriel Kohn, Arry Bussiba, Richard J. Fields
Crack tip opening angle (CTOA) is becoming one of the more widely accepted properties for characterizing fully plastic fracture. In fact, it has been recognized
This report describes the work carried out to provide sensitivity coefficients for the Rockwell HRA and Superficial Rockwell HR15N and HR30N scales. Sensitivity
This paper presents an executable model of grid computing systems and a measurement approach, based on multidimensional analysis, to understand global behavior
Ya-Shian Li-Baboud, Harvey Wohlwend, Lance Rist, Eric D. Simmon
Accurate clock synchronization and time stamping will play an increasingly significant role in ensuring data quality as the semiconductor industry faces an
Eric D. Simmon, Ya-Shian Li-Baboud, John V. Messina
Meeting the rising complexity challenges of Advaced Process Control in semiconductor manufacturing requires improvement in the performance of software and
James S. Albus, Roger V. Bostelman, Tsai H. Hong, William P. Shackleford, Michael O. Shneier
The National Institute of Standards and Technology s (NIST) Intelligent Systems Division (ISD) has been a part of the Defense Advanced Research Project Agency
The available resources for evaluation of moving imagery coding include a variety of subjective and objective methods for quality measurement. These are applied
Andrew Vella, Rhys Whitley, N G. Armstrong, A Dowd, James Cline
The techniques used to identify nanoparticle size and shape characteristics are of vital importance in the development of functional nanoparticles. Each
A High Electron Mobility Transistor (HEMT) is used with a Single Electron Transistor (SET) to measure single electrons tunnelling into individual InGaAs quantum