Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides high resolution (10 nm) magnetization images simultaneously with, but independent of, the topography. Such information is very useful in studying spintronics devices as illustrated by three examples: 1) exchange coupling of magnetic layers, 2) spin-transfer switching in magnetic nanowires, and 3) the ferromagnetic metal-semiconductor interface.
January 1, 2007
Gaithersburg, Maryland, USA
Frontiers of Characterization and Metrology for Nanoelectronics 2007
, Pierce, D.
and Chung, S.
SEMPA Imaging for Spintronics Applications, Frontiers of Characterization and Metrology for Nanoelectronics 2007, Gaithersburg, Maryland, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=620006
(Accessed December 10, 2023)