Unguris, J.
, Pierce, D.
and Chung, S.
(2007),
SEMPA Imaging for Spintronics Applications, Frontiers of Characterization and Metrology for Nanoelectronics 2007, Gaithersburg, Maryland, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=620006
(Accessed October 10, 2025)
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SEMPA Imaging for Spintronics Applications
Published
Author(s)
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Abstract
Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides high resolution (10 nm) magnetization images simultaneously with, but independent of, the topography. Such information is very useful in studying spintronics devices as illustrated by three examples: 1) exchange coupling of magnetic layers, 2) spin-transfer switching in magnetic nanowires, and 3) the ferromagnetic metal-semiconductor interface.Conference Dates
January 1, 2007
Conference Location
Gaithersburg, Maryland, USA
Conference Title
Frontiers of Characterization and Metrology for Nanoelectronics 2007
Pub Type
Conferences
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Keywords
exchange coupling, nanomagnetism, spin polarization, spin reorientation, spin torque transfer, spintronics
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Created December 31, 2006, Updated October 12, 2021