TY  - CONF
AU  - John Unguris
AU  - Daniel Pierce
AU  - Seok-Hwan Chung
C2  - Frontiers of Characterization and Metrology for Nanoelectronics 2007, Gaithersburg, Maryland, USA
DA  - 2007-01-01 00:01:00
LA  - en
PB  - Frontiers of Characterization and Metrology for Nanoelectronics 2007, Gaithersburg, Maryland, USA
PY  - 2007
TI  - SEMPA Imaging for Spintronics Applications
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=620006
ER  -