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Conferences

Crack Tip Opening Angle: Measurement and Modeling of Fracture Resistance in Low and High Strength Pipeline Steels

September 1, 2006

Author(s)

Philippe P. Darcis, Joseph D. McColskey, Christopher N. McCowan, Thomas A. Siewert, Gabriel Kohn, Arry Bussiba, Richard J. Fields

Crack tip opening angle (CTOA) is becoming one of the more widely accepted properties for characterizing fully plastic fracture. In fact, it has been recognized

Determination of Sensitivity Coefficients for Rockwell Hardness Scales HR15N, HR30N, and HRA

September 1, 2006

Author(s)

L Brice, Samuel Low, Rodney D. Jiggetts

This report describes the work carried out to provide sensitivity coefficients for the Rockwell HRA and Superficial Rockwell HR15N and HR30N scales. Sensitivity

Investigating Global Behavior in Computing Grids

September 1, 2006

Author(s)

Kevin L. Mills, Christopher E. Dabrowski

This paper presents an executable model of grid computing systems and a measurement approach, based on multidimensional analysis, to understand global behavior

A New High Precision Procedure for AFM Probe Spring Constant Measurement Using a Microfabricated Calibrated Reference Cantilever Array (CRCA)

September 1, 2006

Author(s)

M G. Reitsma, Richard S. Gates

Intricacies of Time: Demystifying Factory Clock Synchronization and Time Stamping for E-Manufacturing

September 1, 2006

Author(s)

Ya-Shian Li-Baboud, Harvey Wohlwend, Lance Rist, Eric D. Simmon

Accurate clock synchronization and time stamping will play an increasingly significant role in ensuring data quality as the semiconductor industry faces an

Sands of Time: An External Stopwatch for Measuring the Timing of Events in a Computer or Distributed Computing Environment

September 1, 2006

Author(s)

Eric D. Simmon, Ya-Shian Li-Baboud, John V. Messina

Meeting the rising complexity challenges of Advaced Process Control in semiconductor manufacturing requires improvement in the performance of software and

THE LAGR PROJECT - Integrating Learning Into the 4D/RCS Control Hierarchy

August 31, 2006

Author(s)

James S. Albus, Roger V. Bostelman, Tsai H. Hong, William P. Shackleford, Michael O. Shneier

The National Institute of Standards and Technology s (NIST) Intelligent Systems Division (ISD) has been a part of the Defense Advanced Research Project Agency

Comparison of MPEG-2 and AVC Coding on Synthetic Test Materials

August 30, 2006

Author(s)

Charles D. Fenimore, John W. Roberts

The available resources for evaluation of moving imagery coding include a variety of subjective and objective methods for quality measurement. These are applied

Analysis of Admixed CeO₂ Nanoparticles via TEM and X-Ray Diffraction Techniques

August 28, 2006

Author(s)

Andrew Vella, Rhys Whitley, N G. Armstrong, A Dowd, James Cline

The techniques used to identify nanoparticle size and shape characteristics are of vital importance in the development of functional nanoparticles. Each

HEMT Amplified SET Measurements of Individual InGaAs Quantum Dots

August 25, 2006

Author(s)

Kevin Osborn, Mark W. Keller, Richard Mirin

A High Electron Mobility Transistor (HEMT) is used with a Single Electron Transistor (SET) to measure single electrons tunnelling into individual InGaAs quantum

Robot Mapping for Rescue Robots

August 24, 2006

Author(s)

N Adluru, L J. Latecki, R Lakaemper, Rajmohan (. Madhavan

Rescue robots operate in disaster areas where odometric information is known to be highly unreliable. This paper presents a new approach to odometry independent

The Autonomy Levels for Unmanned Systems (ALFUS) Framework: Interim Results

August 23, 2006

Author(s)

Hui-Min Huang

Unmanned systems have become more and more widely used. Yet, various practitioners have different perceptions and different expectations of the systems. They

Characterization and Calibration of an Optical Time Domain Reflectometer Calibrator

August 23, 2006

Author(s)

Donald R. Larson, Nicholas Paulter, Kenneth C. Blaney

We report the results of an investigation into the signal characteristics and behavior of an instrument used to calibrate Optical Time Domain Reflectometers

Metrics and Methodologies for Evaluating Technologies for Intelligence Analysts

August 21, 2006

Author(s)

Emile L. Morse, Michelle P. Steves, Jean C. Scholtz

In this paper we discuss the evaluation methodologies and metrics we have developed for ARDA's Novel Intelligence for Massive Data (NIMD) program. We discuss

Controlled Radical Polymerization in Confined Spaces

August 21, 2006

Author(s)

Kathryn L. Beers

Advanced polymeric materials in applications as diverse as tissue engineering, electronics and personal care products require superior control of a wide range

An Exploratory Study of the W3C Mailing List Test Collection for Retrieval of Emails with Pro/Con Arguments

August 21, 2006

Author(s)

Yejun Wu, Douglas W. Oard, Ian Soboroff

The W3C mailing list test collection, an information retrieval test collection for email, was developed for the TREC Enterprise Search track in 2005. One task

Switching Current Threshold in Planar Systems: An Analytical Approach in the Single Spin Approximation

August 18, 2006

Author(s)

Jacques Miltat, Mark D. Stiles

Automating Thermo-Mechanical Warpage Estimation of PCBs/PCAs using a Design-Analysis Integration Framework

August 18, 2006

Author(s)

Manas Bajaj, Russell Peak, Dirk Zwemer, Thomas Thurman, Lothar Klein, Giedrius Liutkus, Kevin G. Brady, John V. Messina, Mike Dickerson

Accurate prediction, validation and reduction of thermally-induced PCB warpage are critical for enhancing manufacturing yield and reliability in time-to-market

Measuring Color Quality of Light Sources

August 17, 2006

Author(s)

Wendy L. Davis, Yoshihiro Ohno

The successful commercialization of solid-state lighting for general illumination will require an effective method to characterize the color quality of these

Performance Comparisons of InGaAs, Extended InGaAs and Short-Wave HgCdTe Detectors Between 1 [mu]m and 2.5 [mu]m

August 16, 2006

Author(s)

Howard W. Yoon, Matt Dopkiss, George P. Eppeldauer

In this study, three different detectors, regular InGaAs, short-wave infrared extended-InGaAs (exInGaAs) with the bandgap wavelength at 2.6 mm and short-wave

MPEG-7 Multimedia-based Query Format

August 15, 2006

Author(s)

Wo L. Chang

Searching multimedia content for image, audio, and video is getting more attention especially for personal media content due to the affordability of consumer

A Comparison of Test Methods for Early-Age Behavior of Cementitious Materials

August 15, 2006

Author(s)

Jeffrey W. Bullard, Matthew D'Ambrosia, Zachary Grasley, William Hansen, N Kidner, D Lange, Pietro Lura, T Mason, J. Moon, F Rajabipour, G Sant, S Shah, Z Sun, Thomas Voigt, S. Wansom, W Weiss, L Woo

Achieving Higher Photon Counting Rates Using Multiplexed Detectors

August 13, 2006

Author(s)

Stefania Castelletto, Ivo P. Degiovanni, Alan L. Migdall, Sergey Polyakov, V Schettini

As the quantum information field advances, the need for improved single-photon devices is becoming more critical. Quantum information systems are often limited

Retrieval and Clustering from a 3D Human Database based on Body and Head Shape

August 11, 2006

Author(s)

Afzal A. Godil, Sanford P. Ressler

In this paper, we describe a framework for similarity based retrieval and Clustering from a 3D human database. Our technique is based on both body and head

Four-Dimensional X-Ray Microtomography Study of Water Movement During Internal Curing

August 9, 2006

Author(s)

Dale P. Bentz, P M. Halleck, A S. Grader, J W. Roberts

While the effectiveness of internal curing has been verified via a variety of experimental measurements, including internal relative humidity, autogenous

Analysis of Sensitivity of VCCTL Measurements to Various Input Quantities

August 9, 2006

Author(s)

Adriana Hornikova, Blaza Toman, Nien F. Zhang, Hung-Kung Liu, Robert C. Hagwood, Edward J. Garboczi, Jeffrey W. Bullard

Virtual measurements are the outputs of well-defined mathematical models based on theoretical principles and simulation algorithms. The VCCTL (Virtual Cement

Coaxial Line Reflection Method for Dielectric Permittivity of Thin Film Samples at Microwave Frequencies - Numerical and Experimental Analysis

August 9, 2006

Author(s)

Jan Obrzut

We describe a measurement method for broadband dielectric permittivity of thin film materials at microwave frequencies utilizing a small-gap shunt capacitor

The NIST Time Measurement and Analysis Service

August 7, 2006

Author(s)

Michael A. Lombardi, Andrew N. Novick

NIST now offers a new remote calibration service designed to assist laboratories who maintain a accurate local time standard. The service monitors the local

Preliminary Studies of Electromagnetic Properties of Microwave Absorbing Materials used in Calibration Targets

August 4, 2006

Author(s)

Amanda Cox, Michael D. Janezic

As part of the ongoing effort at NIST to develop a microwave brightness temperature standard, we are exploring the electromagnetic and thermal characteristics

Proposed Development of a National Standard for Microwave Brightness Temperature

August 4, 2006

Author(s)

James P. Randa, Amanda Cox, Dave K. Walker

We review the advantages of a national standard for microwave brightness temperature and outline our proposed approach toward developing such a standard. The

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