Analysis of Admixed CeO2 Nanoparticles via TEM and X-Ray Diffraction Techniques
Andrew Vella, Rhys Whitley, N G. Armstrong, A Dowd, James Cline
The techniques used to identify nanoparticle size and shape characteristics are of vital importance in the development of functional nanoparticles. Each technique offers different advantages; this work compares the two techniques of transmission electron microscopy (TEM) and X-ray diffraction (XRD) analysis by characterising CeO2 nanoparticle specimens. Whole Powder Pattern Modelling (WPPM) is used to quantify the specimen dislocations and size characteristics from XRD data. Using admixed samples we test and extend the techniques. We show that XRD accurately characterises small crystallite distributions and that larger crystallite distributions necessitate further investigation.
Annual Condensed Matter and Materials Meeting | 30th | | Australian Institute of Physics
February 7-10, 2006
Wagga Wagga, 1, AS
Annual Condensed Matter and Materials Meeting
bimodal size distributions, crystallite size broadening, microstrain, TEM, X-ray diffraction
, Whitley, R.
, Armstrong, N.
, Dowd, A.
and Cline, J.
Analysis of Admixed CeO<sub>2</sub> Nanoparticles via TEM and X-Ray Diffraction Techniques, Annual Condensed Matter and Materials Meeting | 30th | | Australian Institute of Physics, Wagga Wagga, 1, AS
(Accessed December 11, 2023)