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PUBLICATIONS

A New High Precision Procedure for AFM Probe Spring Constant Measurement Using a Microfabricated Calibrated Reference Cantilever Array (CRCA)

Published

Author(s)

M G. Reitsma, Richard S. Gates
Proceedings Title
NSTI 2006 Nanotechnology Conference
Conference Location
Boston MA, 1
Conference Title
Nanotech 2006 Technical Proceedings Volume 1: pages: 785-788
Pub Type
Conferences

Download Paper

Local Download
Ceramics and Biomaterials

Citation

Reitsma, M. and Gates, R. (2006), A New High Precision Procedure for AFM Probe Spring Constant Measurement Using a Microfabricated Calibrated Reference Cantilever Array (CRCA), NSTI 2006 Nanotechnology Conference , Boston MA, 1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854210 (Accessed October 9, 2025)

Issues

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Created August 31, 2006, Updated October 12, 2021
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