Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

A New High Precision Procedure for AFM Probe Spring Constant Measurement Using a Microfabricated Calibrated Reference Cantilever Array (CRCA)

Published

Author(s)

M G. Reitsma, Richard S. Gates
Proceedings Title
NSTI 2006 Nanotechnology Conference
Conference Location
Boston MA, 1
Conference Title
Nanotech 2006 Technical Proceedings Volume 1: pages: 785-788

Citation

Reitsma, M. and Gates, R. (2006), A New High Precision Procedure for AFM Probe Spring Constant Measurement Using a Microfabricated Calibrated Reference Cantilever Array (CRCA), NSTI 2006 Nanotechnology Conference , Boston MA, 1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854210 (Accessed July 24, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 31, 2006, Updated October 12, 2021