Reitsma, M.
and Gates, R.
(2006),
A New High Precision Procedure for AFM Probe Spring Constant Measurement Using a Microfabricated Calibrated Reference Cantilever Array (CRCA), NSTI 2006 Nanotechnology Conference , Boston MA, 1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854210
(Accessed March 13, 2025)
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A New High Precision Procedure for AFM Probe Spring Constant Measurement Using a Microfabricated Calibrated Reference Cantilever Array (CRCA)
Published
Author(s)
M G. Reitsma,
Proceedings Title
NSTI 2006 Nanotechnology Conference
Conference Location
Boston MA, 1
Conference Title
Nanotech 2006 Technical Proceedings Volume 1: pages: 785-788
Pub Type
Conferences
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created August 31, 2006, Updated October 12, 2021