TY  - CONF
AU  - M Reitsma
AU  - Richard Gates
C2  - NSTI 2006 Nanotechnology Conference , Boston MA, 1
DA  - 2006-09-01 00:09:00
LA  - en
PB  - NSTI 2006 Nanotechnology Conference , Boston MA, 1
PY  - 2006
TI  - A New High Precision Procedure for AFM Probe Spring Constant Measurement Using a Microfabricated Calibrated Reference Cantilever Array (CRCA)
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854210
ER  -