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Conferences

The LAGR Project. Integrating learning into the 4D/RCS Control Hierarchy

Author(s)
James S. Albus, Roger V. Bostelman, Tsai H. Hong, Tommy Chang, William P. Shackleford, Michael O. Shneier
The National Institute of Standards and Technology?s (NIST) Intelligent Systems Division (ISD) is a par-ticipant in the Defense Advanced Research Project Agency

Demonstration of an Active Quantum Key Distribution Network

Author(s)
Xiao Tang, Lijun Ma, Alan Mink, Anastase Nakassis, Hai Xu, Barry J. Hershman, Joshua Bienfang, David H. Su, Ronald Boisvert, Charles W. Clark, Carl J. Williams
We previously demonstrated a high speed, point to point, quantum key distribution (QKD) system with polariztion coding over a fiber link, in which the resulting

Thermal Neutron Demagnetization of NdFeB Magnets

Author(s)
R Klaffky, Richard M. Lindstrom, Brian B. Maranville, Robert D. Shull, B Micklich, J Vacca
To isolate the effect that thermal neutrons have on Nd2Fe14B permanent magnets, the magnetization and coercivity were studied as a function of dose. The changes

Some Difficult Problems in the Modeling of Fire Spread

Author(s)
Kathryn M. Butler, Thomas J. Ohlemiller
A fire and the objects involved in the fire form a highly complex dynamic system. Important processes occur over a wide range of spatial and temporal scales

Trapped atomic ions and quantum information processing

Author(s)
David J. Wineland, Dietrich G. Leibfried, James C. Bergquist, Brad R. Blakestad, John J. Bollinger, Joseph W. Britton, J Chiaverini, Ryan Epstein, David Hume, Wayne M. Itano, John D. Jost, Emanuel H. Knill, Jeroen Koelemeij, C. Langer, R Ozeri, Rainer Reichle, Till P. Rosenband, Tobias Schaetz, Piet Schmidt, Signe Seidelin, Nobuyasu Shiga, Janus Wesenberg
The basic requirements for quantum computing and quantum simulation (Single- and multi-qubit gates, long memor times, etc.)have been demonstrated in separate

On-Wafer Noise-Parameter Measurements at NIST

Author(s)
James P. Randa, Dave K. Walker
NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and

VARIABILITY OF CHARGE NOISE IN Al-BASED SET TRANSISTORS

Author(s)
Mark W. Keller, Blaise Jeanneret, Joe Aumentado
We measured the charge noise of four Al-based SET transistors on multiple cooldowns. We found a consistent 1/f component independent of thermal cycling and
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