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Conferences

The NIST Advance Measurement Laboratory: At the Leading Edge of Measurement Science and Technology

September 20, 2006

Author(s)

C Londono, John R. Lawall, Michael T. Postek, Jack A. Stone Jr., John R. Stoup

The National Institute of Standards and Technology as the U.S. National Metrology Institute has the fundamental responsibility to continuously push the limits...

Fiber Frequency Combs: Development and Applications

September 19, 2006

Author(s)

Nathan R. Newbury, William C. Swann, Ian R. Coddington, John J. McFerran

The output of a femtosecond fiber laser provides a comb of lines in frequency space that can be phase-locked to either a microwave or optical reference to form...

Parametric Uncertainty in Optical Image Modeling

September 18, 2006

Author(s)

James E. Potzick, Egon Marx, M P. Davidson

Optical photomask feature metrology and wafer exposure process simulation both rely on optical image modeling for accurate results. While it is fair to question...

Reduction of Optical Field Noise by Differential Detection in Atomic Clocks Based on Coherent Population Trapping

September 18, 2006

Author(s)

Vladislav Gerginov, Svenja A. Knappe, V Shah, John Kitching, Leo W. Hollberg

We demonstrate a new technique for noise suppression that uses differential detection of the transmission of a linearly- and a circularly polarized beams...

Concrete Rheology: Knowledge and Challenges?

September 13, 2006

Author(s)

Chiara F. Ferraris

The design of concrete with specified properties for an application is not a new science, but it has taken on a new meaning with the wide use of special...

New Approach to Identify Compatibility of Materials for Concrete Related to Early Stiffening

September 13, 2006

Author(s)

Chiara F. Ferraris, Philip R. Taylor

The measurement of the evolution of mechanical characteristics during the setting period of concrete is needed to control the schedule of construction (pumping...

Uncertainty Analysis for Virtual Cement Measurement

September 13, 2006

Author(s)

Blaza Toman, Adriana Hornikova, Robert C. Hagwood, Hung-Kung Liu, Nien F. Zhang, Edward J. Garboczi, Jeffrey W. Bullard

Virtual measurements are the outputs of well-defined mathematical models based on theoretical principles and simulation algorithms. The VCCTL (Virtual Cement...

Effective Link Triggers to Improve Handover Performance

September 11, 2006

Author(s)

Steve Woon, Nada T. Golmie, Y. A. Sekercioglu

Effective link layer triggering is key in order to enable fast and reliable handover across different access networks. In this paper, we investigate the use of...

Unstructured Facility Navigation by Applying the NIST 4D/RCS Architecture

September 5, 2006

Author(s)

Roger V. Bostelman, Tsai Hong Hong, Tommy Chang, William P. Shackleford, Michael O. Shneier

The National Institute of Standards and Technology s (NIST) Intelligent Systems Division (ISD) is working with the material handling industry, specifically on...

Shielding And Attenuation Properties of Large Buildings and Structures

September 4, 2006

Author(s)

Christopher L. Holloway, Galen H. Koepke, Dennis G. Camell, Kate Remley, S. A. Schima, Dylan Williams

For various applications, there is a growing need to understand the shielding and/or attenuation properties of large buildings and structures. In this paper, we...

Applications of Ceramics for Healthcare: The Future Has Begun-

September 1, 2006

Author(s)

Grady S. White

Fractographic Analysis of All Ceramic Restorations

September 1, 2006

Author(s)

George D. Quinn, Janet Quinn, Susanne Scherrer

Software Assurance During Maintenance

September 1, 2006

Author(s)

Paul E. Black

Software testing and maintenance tools must yield widely accepted assurance information in a standardized form. We can then use this information as evidence to...

HLPR Chair* – A Service Robot for the Healthcare Industry

September 1, 2006

Author(s)

Roger V. Bostelman, James S. Albus

The National Institute of Standards and Technology (NIST) Intelligent Systems Division (ISD) has been working on a healthcare mobility system capable of...

Illumination Optimization for Optical Semiconductor Metrology

September 1, 2006

Author(s)

Bryan M. Barnes, L Howard, Richard M. Silver

Uniform sample illumination via K hler illumination, is achieved by establishing a pair of conjugate focal planes; a light source is focused onto the condenser...

Applying NIST SP 800-53 to Industrial Control Systems

September 1, 2006

Author(s)

Stuart W. Katzke, Keith A. Stouffer, Marshall Abrams, David Norton, Joe Weiss

The National Institute of Standards and Technology (NIST) has established an Industrial Control System Security Project to improve the security of public and...

Development of NIST SRM 2881, an Absolute Molecular Mass Distribution Polymer Standard

September 1, 2006

Author(s)

William E. Wallace, Charles M. Guttman, Kathleen M. Flynn, Anthony J. Kearsley

We present a strategy to create an absolute molecular mass distribution polymer Standard Reference Material. To create a standard our methods must be free of...

A Study on Search Engine Use by Intelligence Analysts

September 1, 2006

Author(s)

Don E. Libes, Emile L. Morse, Jean C. Scholtz

This work reports on search engine use by intelligence analysts, generally considered experts at the task of searching for information. Intelligence analysts...

A C-S-H Atomic-Scale Computational Toolkit: Application to Service Life Modeling

September 1, 2006

Author(s)

Kenneth A. Snyder, Raymond D. Mountain, Antonio Faraone

A computational toolkit is being developed for studying materials relevant to portland cement hydration. The toolkit will eventually include both a materials...

Smart Card Authentication for Mobile Devices

September 1, 2006

Author(s)

Wayne Jansen, Serban I. Gavrila, Clement Seveillac

While mobile handheld devices provide productivity benefits, they also pose new risks. User authentication is the best safeguard against the risk of...

Quantum Dots Detection for HER2 Standard Reference Material

September 1, 2006

Author(s)

Yan Xiao, J L. Blasic, Marcia J. Holden, Peter E. Barker

Fatigue Crack Growth Rates in Five Pipeline Steels

September 1, 2006

Author(s)

Arry Bussiba, Philippe P. Darcis, J D. McCloskey, Christopher N. McCowan, Thomas A. Siewert, Gabriel Kohn, R P. Smith, J. Merritt

This study presents fatigue data for six different pipeline steels, with strengths ranging from Grade B to X100. A fatigue crack growth test for full-thickness...

Wideband Large-Signal RF Measurements Applied to Behavioral Model Extraction

September 1, 2006

Author(s)

Kate Remley, M. Myslinski, Dominique Schreurs, Bart Nauwelaers

This work presents for the first time wideband Large Signal Network Analyzer (LSNA) measurements used to extract a large-signal behavioral model of an RF...

Proposal for Development of a National Microwave Brightness-Temperature Standard

September 1, 2006

Author(s)

James P. Randa, Amanda Cox, Dave K. Walker

We review the advantages of a national standard for microwave brightness temperature and outline our proposed approach toward developing such a standard. The...

Crack Tip Opening Angle: Measurement and Modeling of Fracture Resistance in Low and High Strength Pipeline Steels

September 1, 2006

Author(s)

Philippe P. Darcis, Joseph D. McColskey, Christopher N. McCowan, Thomas A. Siewert, Gabriel Kohn, Arry Bussiba, Richard J. Fields

Crack tip opening angle (CTOA) is becoming one of the more widely accepted properties for characterizing fully plastic fracture. In fact, it has been recognized...

Determination of Sensitivity Coefficients for Rockwell Hardness Scales HR15N, HR30N, and HRA

September 1, 2006

Author(s)

L Brice, Samuel Low, Rodney D. Jiggetts

This report describes the work carried out to provide sensitivity coefficients for the Rockwell HRA and Superficial Rockwell HR15N and HR30N scales. Sensitivity...

A New High Precision Procedure for AFM Probe Spring Constant Measurement Using a Microfabricated Calibrated Reference Cantilever Array (CRCA)

September 1, 2006

Author(s)

M G. Reitsma, Richard S. Gates

Sands of Time: An External Stopwatch for Measuring the Timing of Events in a Computer or Distributed Computing Environment

September 1, 2006

Author(s)

Eric D. Simmon, Ya-Shian Li-Baboud, John V. Messina

Meeting the rising complexity challenges of Advaced Process Control in semiconductor manufacturing requires improvement in the performance of software and...

Intricacies of Time: Demystifying Factory Clock Synchronization and Time Stamping for E-Manufacturing

September 1, 2006

Author(s)

Ya-Shian Li-Baboud, Harvey Wohlwend, Lance Rist, Eric D. Simmon

Accurate clock synchronization and time stamping will play an increasingly significant role in ensuring data quality as the semiconductor industry faces an...

Investigating Global Behavior in Computing Grids

September 1, 2006

Author(s)

Kevin L. Mills, Christopher E. Dabrowski

This paper presents an executable model of grid computing systems and a measurement approach, based on multidimensional analysis, to understand global behavior...

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