Tang, Y.
(2006),
An Overview of the Josephson Voltage Standard Interlaboratory Comparison, Conference Proceedings of NCSL International Workshop and Symposium, Nashville, TN, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32308
(Accessed October 16, 2025)
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An Overview of the Josephson Voltage Standard Interlaboratory Comparison
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Author(s)
Abstract
A majority of Josephson Voltage Standard (JVS) interlaboratory comparisons have been performed by using Zener voltage transfer standards and a protocol based on the Measurement Assurance Program (MAP) with uncertainties in the range of a few parts in 108 at 10 V that are limited by the Zener characteristics. In order to improve the uncertainty of the comparison, protocols using a compact Josephson voltage standard (CJVS) as the transfer standard have been developed. The uncertainty using the CJVS in the comparison can be in the range of a few parts in 109 at 10 V. The array to array direct comparison using the conventional JVS or programmable JVS (PJVS) can further improve the uncertainty of the comparison.Proceedings Title
Conference Proceedings of NCSL International Workshop and Symposium
Conference Dates
August 6-10, 2006
Conference Location
Nashville, TN
Pub Type
Conferences
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Keywords
compact JVS, interlaboratory comparison (ILC), JVS, programmable JVS, Measurement Assurance Program (MAP), uncertainty
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Created August 1, 2006, Updated January 27, 2020