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National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report

Published

Author(s)

Michael T. Postek, Richard R. Cavanagh, C M. Allocca, Douglas T. Smith, Robert D. Shull, David A. Wollman, David G. Seiler, Stephen Knight, A Diebold, Richard M. Silver, Charles W. Clark, Kevin W. Lyons, James R. Whetstone, Ronald F. Boisvert
Proceedings Title
National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report
Conference Dates
January 27-29, 2004
Conference Location
Gaithersburg, MD
Conference Title
National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology

Keywords

metrology, nanocharacterization, nanoelectronics, nanofabrication, nanomagnetic, nanomanufacturing, nanomechanics, nanotechnology, photonics

Citation

Postek, M. , Cavanagh, R. , Allocca, C. , Smith, D. , Shull, R. , Wollman, D. , Seiler, D. , Knight, S. , Diebold, A. , Silver, R. , Clark, C. , Lyons, K. , Whetstone, J. and Boisvert, R. (2006), National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report, National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report, Gaithersburg, MD (Accessed October 21, 2021)
Created August 1, 2006, Updated February 19, 2017