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Conferences

TOWARDS A TEST METHOD FOR HYDROGEN SENSOR PERFORMANCE

Author(s)
Nathan D. Marsh, Thomas G. Cleary
As part of an effort to develop standard test methods for the performance of commercial hydrogen sensors, we employed the Fire Emulator / Detector Evaluator, an...

HYDROGEN PIPELINE RESEARCH AT NIST

Author(s)
Thomas A. Siewert, Joseph D. McColskey, Angelique N. Lasseigne
In 2007, the National Institute of Standards and Technology greatly expanded its efforts in support of the use of hydrogen as a fuel. Various NIST divisions...

The CLEAR 2007 Evaluation

Author(s)
Rainer Stiefelhagen, Keni Bernardin, R Bowers, Richard T. Rose, Martial Michel, John S. Garofolo
This paper is a summary of the 2007 CLEAR Evaluation on the Classification of Events, Activities, and Relationships which took place in early 2007 and...

Towards Accurate Feature Shape Metrology

Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, B Bunday, J Allgair
Over the last few years, the need for shape metrology for process control has increased. A key component of shape metrology is sidewall angle (SWA). However...

A Computational Model of the Human Visual Cortex

Author(s)
James S. Albus
The brain is first and foremost a control system that is capable of building an internal representation of the external world, and using this representation to...

Imaging with modular linear arrays of cryogenic Nb microbolometers

Author(s)
Erich N. Grossman, Charles Dietlein, Jon E. Bjarnason, Mabel Ramirez, M. Leivo, J. A. Penttila, P. Helisto, A. Luukanen
We present ultrawideband imagery obtained with modular, 8-element, superconducting Nb microbolometer arrays. Conically scanned images are presented and compared...

Fiber lasers for frequency standards in optical communications

Author(s)
Nathan R. Newbury, William C. Swann, Ian R. Coddington, Paul A. Williams
Optical light with millihertz relative frequency stabilities and subfemtosecond timing jitter can be produced from stabilized cw or mode-locked fiber lasers. We...

Characterization of the Latent Image to Developed Image in Model EUV Photoresists

Author(s)
John T. Woodward IV, Kwang-Woo Choi, Vivek Prabhu, Shuhui Kang, Kristopher Lavery, Wen-Li Wu, Michael Leeson, Anuja De Silva, Nelson Felix, Christopher K. Ober
Current extreme ultraviolet (EUV) photoresist materials do not yet meet exposure-dose sensitivity, line-width roughness, and resolution requirements. In order...
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